Analysis of ionizing and department damage mechanism in proton-irradiation-induced scientific charge-coupled device

Wen Lin; Li Yu-Dong; Guo Qi; Ren Di-Yuan; Wang Bo; Maria

doi:10.7498/aps.64.024220

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Wen Lin, Li Yu-Dong, Guo Qi, Ren Di-Yuan, Wang Bo, Maria. Analysis of ionizing and department damage mechanism in proton-irradiation-induced scientific charge-coupled deviceJ. Acta Physica Sinica, 2015, 64(2): 024220. DOI: 10.7498/aps.64.024220

Citation:

Wen Lin, Li Yu-Dong, Guo Qi, Ren Di-Yuan, Wang Bo, Maria. Analysis of ionizing and department damage mechanism in proton-irradiation-induced scientific charge-coupled deviceJ. Acta Physica Sinica, 2015, 64(2): 024220. DOI: 10.7498/aps.64.024220

Citation:

Wen Lin, Li Yu-Dong, Guo Qi, Ren Di-Yuan, Wang Bo, Maria. Analysis of ionizing and department damage mechanism in proton-irradiation-induced scientific charge-coupled deviceJ. Acta Physica Sinica, 2015, 64(2): 024220. DOI: 10.7498/aps.64.024220