Calculation of single event upset based on Monte Carlo and device simulations

Wang Xiao-Han; Guo Hong-Xia; Lei Zhi-Feng; Guo Gang; Zhang Ke-Ying; Gao Li-Juan; Zhang Zhan-Gang

doi:10.7498/aps.63.196102

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Wang Xiao-Han, Guo Hong-Xia, Lei Zhi-Feng, Guo Gang, Zhang Ke-Ying, Gao Li-Juan, Zhang Zhan-Gang. Calculation of single event upset based on Monte Carlo and device simulationsJ. Acta Physica Sinica, 2014, 63(19): 196102. DOI: 10.7498/aps.63.196102

Citation:

Wang Xiao-Han, Guo Hong-Xia, Lei Zhi-Feng, Guo Gang, Zhang Ke-Ying, Gao Li-Juan, Zhang Zhan-Gang. Calculation of single event upset based on Monte Carlo and device simulationsJ. Acta Physica Sinica, 2014, 63(19): 196102. DOI: 10.7498/aps.63.196102

Citation:

Wang Xiao-Han, Guo Hong-Xia, Lei Zhi-Feng, Guo Gang, Zhang Ke-Ying, Gao Li-Juan, Zhang Zhan-Gang. Calculation of single event upset based on Monte Carlo and device simulationsJ. Acta Physica Sinica, 2014, 63(19): 196102. DOI: 10.7498/aps.63.196102