Introduction of two-dimensional defects in inverse opal films by means of planar lithography and sol-gel co-assembly methods

Li Long; Wang Ming; Ni Hai-Bin; Shen Tian-Yi

doi:10.7498/aps.63.054206

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Li Long, Wang Ming, Ni Hai-Bin, Shen Tian-Yi. Introduction of two-dimensional defects in inverse opal films by means of planar lithography and sol-gel co-assembly methodsJ. Acta Physica Sinica, 2014, 63(5): 054206. DOI: 10.7498/aps.63.054206

Citation:

Li Long, Wang Ming, Ni Hai-Bin, Shen Tian-Yi. Introduction of two-dimensional defects in inverse opal films by means of planar lithography and sol-gel co-assembly methodsJ. Acta Physica Sinica, 2014, 63(5): 054206. DOI: 10.7498/aps.63.054206

Citation:

Li Long, Wang Ming, Ni Hai-Bin, Shen Tian-Yi. Introduction of two-dimensional defects in inverse opal films by means of planar lithography and sol-gel co-assembly methodsJ. Acta Physica Sinica, 2014, 63(5): 054206. DOI: 10.7498/aps.63.054206