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中国物理学会期刊
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Yang Xin-Xin, Wei Xiao-Xu, Wang Jun-Zhuan, Shi Yi, Zheng You-Liao. Properties in vanadium dioxide thin film synthesized from V2O5 annealed in H2/Ar ambienceJ. Acta Physica Sinica, 2013, 62(22): 227201. DOI: 10.7498/aps.62.227201
Citation: Yang Xin-Xin, Wei Xiao-Xu, Wang Jun-Zhuan, Shi Yi, Zheng You-Liao. Properties in vanadium dioxide thin film synthesized from V2O5 annealed in H2/Ar ambienceJ. Acta Physica Sinica, 2013, 62(22): 227201. DOI: 10.7498/aps.62.227201
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Properties in vanadium dioxide thin film synthesized from V2O5 annealed in H2/Ar ambience

Acta Phys. Sin., 2013, 62(22): 227201.
DOI: 10.7498/aps.62.227201
CSTR: 32037.14.aps.62.227201
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