Zhang Yue, Zhuo Qing-Qing, Liu Hong-Xia, Ma Xiao-Hua, Hao Yue. Flat-roof of dynamic equilibrium phenomenon in static negative biase temperature instability effect on power metal-oxide-semiconductor field-effect transistorJ. Acta Physica Sinica, 2013, 62(16): 167305. DOI: 10.7498/aps.62.167305