Serial ferroelectric memory ionizing radiation effects and annealing characteristics

Zhang Xing-Yao; Guo Qi; Lu Wu; Zhang Xiao-Fu; Zheng Qi-Wen; Cui Jiang-Wei; Li Yu-Dong; Zhou Dong

doi:10.7498/aps.62.156107

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Zhang Xing-Yao, Guo Qi, Lu Wu, Zhang Xiao-Fu, Zheng Qi-Wen, Cui Jiang-Wei, Li Yu-Dong, Zhou Dong. Serial ferroelectric memory ionizing radiation effects and annealing characteristicsJ. Acta Physica Sinica, 2013, 62(15): 156107. DOI: 10.7498/aps.62.156107

Citation:

Zhang Xing-Yao, Guo Qi, Lu Wu, Zhang Xiao-Fu, Zheng Qi-Wen, Cui Jiang-Wei, Li Yu-Dong, Zhou Dong. Serial ferroelectric memory ionizing radiation effects and annealing characteristicsJ. Acta Physica Sinica, 2013, 62(15): 156107. DOI: 10.7498/aps.62.156107

Citation:

Zhang Xing-Yao, Guo Qi, Lu Wu, Zhang Xiao-Fu, Zheng Qi-Wen, Cui Jiang-Wei, Li Yu-Dong, Zhou Dong. Serial ferroelectric memory ionizing radiation effects and annealing characteristicsJ. Acta Physica Sinica, 2013, 62(15): 156107. DOI: 10.7498/aps.62.156107