Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates

Pan Hui-Ping; Cheng Feng-Feng; Li Lin; Horng Ray-Hua; Yao Shu-De

doi:10.7498/aps.62.048801

Search

x

Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De. Structrual analyses of Ga2+xO3-x thin films grown on sapphire substratesJ. Acta Physica Sinica, 2013, 62(4): 048801. DOI: 10.7498/aps.62.048801

Citation:

Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De. Structrual analyses of Ga2+xO3-x thin films grown on sapphire substratesJ. Acta Physica Sinica, 2013, 62(4): 048801. DOI: 10.7498/aps.62.048801

Citation:

Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De. Structrual analyses of Ga2+xO3-x thin films grown on sapphire substratesJ. Acta Physica Sinica, 2013, 62(4): 048801. DOI: 10.7498/aps.62.048801