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中国物理学会期刊
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Wei Xiao-Ying, Hu Ming, Zhang Kai-Liang, Wang Fang, Liu Kai. Micro-structural and resistive switching properties of vanadium oxide thin filmsJ. Acta Physica Sinica, 2013, 62(4): 047201. DOI: 10.7498/aps.62.047201
Citation: Wei Xiao-Ying, Hu Ming, Zhang Kai-Liang, Wang Fang, Liu Kai. Micro-structural and resistive switching properties of vanadium oxide thin filmsJ. Acta Physica Sinica, 2013, 62(4): 047201. DOI: 10.7498/aps.62.047201
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Micro-structural and resistive switching properties of vanadium oxide thin films

Acta Phys. Sin., 2013, 62(4): 047201.
DOI: 10.7498/aps.62.047201
CSTR: 32037.14.aps.62.047201
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