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中国物理学会期刊
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He Liang, Du Lei, Huang Xiao-Jun, Chen Hua, Chen Wen-Hao, Sun Peng, Han Liang. Non-Gaussian analysis of noise for metal interconnection electromigrationJ. Acta Physica Sinica, 2012, 61(20): 206601. DOI: 10.7498/aps.61.206601
Citation: He Liang, Du Lei, Huang Xiao-Jun, Chen Hua, Chen Wen-Hao, Sun Peng, Han Liang. Non-Gaussian analysis of noise for metal interconnection electromigrationJ. Acta Physica Sinica, 2012, 61(20): 206601. DOI: 10.7498/aps.61.206601
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Non-Gaussian analysis of noise for metal interconnection electromigration

Acta Phys. Sin., 2012, 61(20): 206601.
DOI: 10.7498/aps.61.206601
CSTR: 32037.14.aps.61.206601
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