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中国物理学会期刊
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Zhou Xin-Jie, Li Lei-Lei, Zhou Yi, Luo Jing, Yu Zong-Guang. Back-gate bias effect on partially depleted SOI/MOS back-gate performances under radiation conditionJ. Acta Physica Sinica, 2012, 61(20): 206102. DOI: 10.7498/aps.61.206102
Citation: Zhou Xin-Jie, Li Lei-Lei, Zhou Yi, Luo Jing, Yu Zong-Guang. Back-gate bias effect on partially depleted SOI/MOS back-gate performances under radiation conditionJ. Acta Physica Sinica, 2012, 61(20): 206102. DOI: 10.7498/aps.61.206102
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Back-gate bias effect on partially depleted SOI/MOS back-gate performances under radiation condition

Acta Phys. Sin., 2012, 61(20): 206102.
DOI: 10.7498/aps.61.206102
CSTR: 32037.14.aps.61.206102
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