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中国物理学会期刊
Ma Zhen-Yang, Chai Chang-Chun, Ren Xing-Rong, Yang Yin-Tang, Chen Bin. The damage effect and mechanism of the bipolar transistor caused by microwavesJ. Acta Physica Sinica, 2012, 61(7): 078501. DOI: 10.7498/aps.61.078501
Citation: Ma Zhen-Yang, Chai Chang-Chun, Ren Xing-Rong, Yang Yin-Tang, Chen Bin. The damage effect and mechanism of the bipolar transistor caused by microwavesJ. Acta Physica Sinica, 2012, 61(7): 078501. DOI: 10.7498/aps.61.078501

The damage effect and mechanism of the bipolar transistor caused by microwaves

CSTR: 32037.14.aps.61.078501
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