Slow highly charged ions induced electron emission from clean Si surfaces

Wang Jian-Guo; Xu Zhong-Feng; Zhao Yong-Tao; Wang Yu-Yu; Li De-Hui; Zhao Di; Xiao Guo-Qing

doi:10.7498/aps.59.7803

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Wang Jian-Guo, Xu Zhong-Feng, Zhao Yong-Tao, Wang Yu-Yu, Li De-Hui, Zhao Di, Xiao Guo-Qing. Slow highly charged ions induced electron emission from clean Si surfacesJ. Acta Physica Sinica, 2010, 59(11): 7803-7807. DOI: 10.7498/aps.59.7803

Citation:

Wang Jian-Guo, Xu Zhong-Feng, Zhao Yong-Tao, Wang Yu-Yu, Li De-Hui, Zhao Di, Xiao Guo-Qing. Slow highly charged ions induced electron emission from clean Si surfacesJ. Acta Physica Sinica, 2010, 59(11): 7803-7807. DOI: 10.7498/aps.59.7803

Citation:

Wang Jian-Guo, Xu Zhong-Feng, Zhao Yong-Tao, Wang Yu-Yu, Li De-Hui, Zhao Di, Xiao Guo-Qing. Slow highly charged ions induced electron emission from clean Si surfacesJ. Acta Physica Sinica, 2010, 59(11): 7803-7807. DOI: 10.7498/aps.59.7803