Properties of photon counting imaging system with Si thin films

Zhao Fei-Fei; Liu Yong-An; Hu Hui-Jun; Zhao Bao-Sheng

doi:10.7498/aps.59.7096

Zhao Fei-Fei, Liu Yong-An, Hu Hui-Jun, Zhao Bao-Sheng. Properties of photon counting imaging system with Si thin filmsJ. Acta Physica Sinica, 2010, 59(10): 7096-7104. DOI: 10.7498/aps.59.7096

Citation:

Zhao Fei-Fei, Liu Yong-An, Hu Hui-Jun, Zhao Bao-Sheng. Properties of photon counting imaging system with Si thin filmsJ. Acta Physica Sinica, 2010, 59(10): 7096-7104. DOI: 10.7498/aps.59.7096

Citation:

Zhao Fei-Fei, Liu Yong-An, Hu Hui-Jun, Zhao Bao-Sheng. Properties of photon counting imaging system with Si thin filmsJ. Acta Physica Sinica, 2010, 59(10): 7096-7104. DOI: 10.7498/aps.59.7096