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中国物理学会期刊
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Qiao Jian-Liang, Chang Ben-Kang, Du Xiao-Qing, Niu Jun, Zou Ji-Jun. Quantum efficiency decay mechanism for reflection-mode negative electron affinity GaN photocathodeJ. Acta Physica Sinica, 2010, 59(4): 2855-2859. DOI: 10.7498/aps.59.2855
Citation: Qiao Jian-Liang, Chang Ben-Kang, Du Xiao-Qing, Niu Jun, Zou Ji-Jun. Quantum efficiency decay mechanism for reflection-mode negative electron affinity GaN photocathodeJ. Acta Physica Sinica, 2010, 59(4): 2855-2859. DOI: 10.7498/aps.59.2855
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Quantum efficiency decay mechanism for reflection-mode negative electron affinity GaN photocathode

Acta Phys. Sin., 2010, 59(4): 2855-2859.
DOI: 10.7498/aps.59.2855
CSTR: 32037.14.aps.59.2855
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