Chen Huan-Ting, Lü Yi-Jun, Chen Zhong, Zhang Hai-Bing, Gao Yu-Lin, Chen Guo-Long. Analysis of degradation mechanism of GaN blue light emitting diode by the characteristics of capacitance and conductanceJ. Acta Physica Sinica, 2009, 58(8): 5700-5704. DOI: 10.7498/aps.58.5700
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Citation:
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Chen Huan-Ting, Lü Yi-Jun, Chen Zhong, Zhang Hai-Bing, Gao Yu-Lin, Chen Guo-Long. Analysis of degradation mechanism of GaN blue light emitting diode by the characteristics of capacitance and conductanceJ. Acta Physica Sinica, 2009, 58(8): 5700-5704. DOI: 10.7498/aps.58.5700
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Chen Huan-Ting, Lü Yi-Jun, Chen Zhong, Zhang Hai-Bing, Gao Yu-Lin, Chen Guo-Long. Analysis of degradation mechanism of GaN blue light emitting diode by the characteristics of capacitance and conductanceJ. Acta Physica Sinica, 2009, 58(8): 5700-5704. DOI: 10.7498/aps.58.5700
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Citation:
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Chen Huan-Ting, Lü Yi-Jun, Chen Zhong, Zhang Hai-Bing, Gao Yu-Lin, Chen Guo-Long. Analysis of degradation mechanism of GaN blue light emitting diode by the characteristics of capacitance and conductanceJ. Acta Physica Sinica, 2009, 58(8): 5700-5704. DOI: 10.7498/aps.58.5700
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