Zheng Yu-Zhan, Lu Wu, Ren Di-Yuan, Wang Yi-Yuan, Guo Qi, Yu Xue-Feng, He Cheng-Fa. Characteristics of high- and low-dose-rate damage for domestic npn transistors of various emitter areasJ. Acta Physica Sinica, 2009, 58(8): 5572-5577. DOI: 10.7498/aps.58.5572
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Citation:
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Zheng Yu-Zhan, Lu Wu, Ren Di-Yuan, Wang Yi-Yuan, Guo Qi, Yu Xue-Feng, He Cheng-Fa. Characteristics of high- and low-dose-rate damage for domestic npn transistors of various emitter areasJ. Acta Physica Sinica, 2009, 58(8): 5572-5577. DOI: 10.7498/aps.58.5572
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Zheng Yu-Zhan, Lu Wu, Ren Di-Yuan, Wang Yi-Yuan, Guo Qi, Yu Xue-Feng, He Cheng-Fa. Characteristics of high- and low-dose-rate damage for domestic npn transistors of various emitter areasJ. Acta Physica Sinica, 2009, 58(8): 5572-5577. DOI: 10.7498/aps.58.5572
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Citation:
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Zheng Yu-Zhan, Lu Wu, Ren Di-Yuan, Wang Yi-Yuan, Guo Qi, Yu Xue-Feng, He Cheng-Fa. Characteristics of high- and low-dose-rate damage for domestic npn transistors of various emitter areasJ. Acta Physica Sinica, 2009, 58(8): 5572-5577. DOI: 10.7498/aps.58.5572
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