Zhang Zeng, Zhang Rong, Xie Zi-Li, Liu Bin, Xiu Xiang-Qian, Li Yi, Fu De-Yi, Lu Hai, Chen Peng, Han Ping, Zheng You-Dou, Tang Chen-Guang, Chen Yong-Hai, Wang Zhan-Guo. Thickness dependent dislocation, electrical and optical properties in InN films grown by MOCVDJ. Acta Physica Sinica, 2009, 58(5): 3416-3420. DOI: 10.7498/aps.58.3416