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中国物理学会期刊
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He Liang, Du Lei, Zhuang Yi-Qi, Li Wei-Hua, Chen Jian-Ping. Multiscale entropy complexity analysis of metallic interconnection electromigration noiseJ. Acta Physica Sinica, 2008, 57(10): 6545-6550. DOI: 10.7498/aps.57.6545
Citation: He Liang, Du Lei, Zhuang Yi-Qi, Li Wei-Hua, Chen Jian-Ping. Multiscale entropy complexity analysis of metallic interconnection electromigration noiseJ. Acta Physica Sinica, 2008, 57(10): 6545-6550. DOI: 10.7498/aps.57.6545
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Multiscale entropy complexity analysis of metallic interconnection electromigration noise

Acta Phys. Sin., 2008, 57(10): 6545-6550.
DOI: 10.7498/aps.57.6545
CSTR: 32037.14.aps.57.6545
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