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中国物理学会期刊
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Zhao Wen-Bin, Zhang Guan-Jun, Yan Zhang. Investigation on surface damage phenomena induced by flashover across semiconductorJ. Acta Physica Sinica, 2008, 57(8): 5130-5137. DOI: 10.7498/aps.57.5130
Citation: Zhao Wen-Bin, Zhang Guan-Jun, Yan Zhang. Investigation on surface damage phenomena induced by flashover across semiconductorJ. Acta Physica Sinica, 2008, 57(8): 5130-5137. DOI: 10.7498/aps.57.5130
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Investigation on surface damage phenomena induced by flashover across semiconductor

Acta Phys. Sin., 2008, 57(8): 5130-5137.
DOI: 10.7498/aps.57.5130
CSTR: 32037.14.aps.57.5130
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