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中国物理学会期刊
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Luan Su-Zhen, Liu Hong-Xia, Jia Ren-Xu. The dynamic reliability of ultra-thin gate oxide and its breakdown characteristicsJ. Acta Physica Sinica, 2008, 57(4): 2524-2528. DOI: 10.7498/aps.57.2524
Citation: Luan Su-Zhen, Liu Hong-Xia, Jia Ren-Xu. The dynamic reliability of ultra-thin gate oxide and its breakdown characteristicsJ. Acta Physica Sinica, 2008, 57(4): 2524-2528. DOI: 10.7498/aps.57.2524
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The dynamic reliability of ultra-thin gate oxide and its breakdown characteristics

Acta Phys. Sin., 2008, 57(4): 2524-2528.
DOI: 10.7498/aps.57.2524
CSTR: 32037.14.aps.57.2524
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