Research on correlation of 1/fγ noise and hot carrier degradation in metal oxide semiconductor field effect transistor

Liu Yu-An; Du Lei; Bao Jun-Lin

doi:10.7498/aps.57.2468

Search

x

Liu Yu-An, Du Lei, Bao Jun-Lin. Research on correlation of 1/fγ noise and hot carrier degradation in metal oxide semiconductor field effect transistorJ. Acta Physica Sinica, 2008, 57(4): 2468-2475. DOI: 10.7498/aps.57.2468

Citation:

Liu Yu-An, Du Lei, Bao Jun-Lin. Research on correlation of 1/fγ noise and hot carrier degradation in metal oxide semiconductor field effect transistorJ. Acta Physica Sinica, 2008, 57(4): 2468-2475. DOI: 10.7498/aps.57.2468

Citation:

Liu Yu-An, Du Lei, Bao Jun-Lin. Research on correlation of 1/fγ noise and hot carrier degradation in metal oxide semiconductor field effect transistorJ. Acta Physica Sinica, 2008, 57(4): 2468-2475. DOI: 10.7498/aps.57.2468