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中国物理学会期刊
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Wu Ying-Cai, Gu Zheng-Tian. Research on the optimum thickness of metallic thin film utilized to excite surface plasmon resonanceJ. Acta Physica Sinica, 2008, 57(4): 2295-2299. DOI: 10.7498/aps.57.2295
Citation: Wu Ying-Cai, Gu Zheng-Tian. Research on the optimum thickness of metallic thin film utilized to excite surface plasmon resonanceJ. Acta Physica Sinica, 2008, 57(4): 2295-2299. DOI: 10.7498/aps.57.2295
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Research on the optimum thickness of metallic thin film utilized to excite surface plasmon resonance

Acta Phys. Sin., 2008, 57(4): 2295-2299.
DOI: 10.7498/aps.57.2295
CSTR: 32037.14.aps.57.2295
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