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中国物理学会期刊
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Chen Chun-Xia, Du Lei, He Liang, Hu Jin, Huang Xiao-Jun, Wei Tao. Fractal character of noise in electromigration in metel interconnectionJ. Acta Physica Sinica, 2007, 56(11): 6674-6679. DOI: 10.7498/aps.56.6674
Citation: Chen Chun-Xia, Du Lei, He Liang, Hu Jin, Huang Xiao-Jun, Wei Tao. Fractal character of noise in electromigration in metel interconnectionJ. Acta Physica Sinica, 2007, 56(11): 6674-6679. DOI: 10.7498/aps.56.6674
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Fractal character of noise in electromigration in metel interconnection

Acta Phys. Sin., 2007, 56(11): 6674-6679.
DOI: 10.7498/aps.56.6674
CSTR: 32037.14.aps.56.6674
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