Characterization of Ni/Au GaN Schottky contact base on I-V-T and C-V-T measurements

Liu Jie; Hao Yue; Feng Qian; Wang Chong; Zhang Jin-Cheng; Guo Liang-Liang

doi:10.7498/aps.56.3483

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Liu Jie, Hao Yue, Feng Qian, Wang Chong, Zhang Jin-Cheng, Guo Liang-Liang. Characterization of Ni/Au GaN Schottky contact base on I-V-T and C-V-T measurementsJ. Acta Physica Sinica, 2007, 56(6): 3483-3487. DOI: 10.7498/aps.56.3483

Citation:

Liu Jie, Hao Yue, Feng Qian, Wang Chong, Zhang Jin-Cheng, Guo Liang-Liang. Characterization of Ni/Au GaN Schottky contact base on I-V-T and C-V-T measurementsJ. Acta Physica Sinica, 2007, 56(6): 3483-3487. DOI: 10.7498/aps.56.3483

Citation:

Liu Jie, Hao Yue, Feng Qian, Wang Chong, Zhang Jin-Cheng, Guo Liang-Liang. Characterization of Ni/Au GaN Schottky contact base on I-V-T and C-V-T measurementsJ. Acta Physica Sinica, 2007, 56(6): 3483-3487. DOI: 10.7498/aps.56.3483