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中国物理学会期刊
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Li Rui-Min, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin. A 1/f noise based research of radiation induced interface trap buildup processJ. Acta Physica Sinica, 2007, 56(6): 3400-3406. DOI: 10.7498/aps.56.3400
Citation: Li Rui-Min, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin. A 1/f noise based research of radiation induced interface trap buildup processJ. Acta Physica Sinica, 2007, 56(6): 3400-3406. DOI: 10.7498/aps.56.3400
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A 1/f noise based research of radiation induced interface trap buildup process

Acta Phys. Sin., 2007, 56(6): 3400-3406.
DOI: 10.7498/aps.56.3400
CSTR: 32037.14.aps.56.3400
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