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中国物理学会期刊
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Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing. Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivityJ. Acta Physica Sinica, 2007, 56(4): 2422-2427. DOI: 10.7498/aps.56.2422
Citation: Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing. Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivityJ. Acta Physica Sinica, 2007, 56(4): 2422-2427. DOI: 10.7498/aps.56.2422
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Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity

Acta Phys. Sin., 2007, 56(4): 2422-2427.
DOI: 10.7498/aps.56.2422
CSTR: 32037.14.aps.56.2422
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