Investigation of the precision of curved surface fitting in the measurement of near-cylindrical surfaces’ mid-wavelength deformations

Xie Ben-Chao; Lu Zhen-Wu; Li Feng-You

doi:10.7498/aps.54.3144

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Xie Ben-Chao, Lu Zhen-Wu, Li Feng-You. Investigation of the precision of curved surface fitting in the measurement of near-cylindrical surfaces’ mid-wavelength deformationsJ. Acta Physica Sinica, 2005, 54(7): 3144-3148. DOI: 10.7498/aps.54.3144

Citation:

Xie Ben-Chao, Lu Zhen-Wu, Li Feng-You. Investigation of the precision of curved surface fitting in the measurement of near-cylindrical surfaces’ mid-wavelength deformationsJ. Acta Physica Sinica, 2005, 54(7): 3144-3148. DOI: 10.7498/aps.54.3144

Citation:

Xie Ben-Chao, Lu Zhen-Wu, Li Feng-You. Investigation of the precision of curved surface fitting in the measurement of near-cylindrical surfaces’ mid-wavelength deformationsJ. Acta Physica Sinica, 2005, 54(7): 3144-3148. DOI: 10.7498/aps.54.3144