Search

x
中国物理学会期刊
Advanced Search
Wang Yuan, Xu Ke-Wei. Cu-W Thin film characterized by surface fractal and resistivityJ. Acta Physica Sinica, 2004, 53(3): 900-904. DOI: 10.7498/aps.53.900
Citation: Wang Yuan, Xu Ke-Wei. Cu-W Thin film characterized by surface fractal and resistivityJ. Acta Physica Sinica, 2004, 53(3): 900-904. DOI: 10.7498/aps.53.900
shu

Cu-W Thin film characterized by surface fractal and resistivity

Acta Phys. Sin., 2004, 53(3): 900-904.
DOI: 10.7498/aps.53.900
CSTR: 32037.14.aps.53.900
PDF
Get Citation

  • Abstract

    Authors and contacts

    References

Turn off MathJax
Article Contents

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return
    Baidu
    map