On micro scanning forces under the coupling deformation of atomic force microscope probe

Zhang Xiang-Jun; Meng Yong-Gang; Wen Shi-Zhu

doi:10.7498/aps.53.728

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Zhang Xiang-Jun, Meng Yong-Gang, Wen Shi-Zhu. On micro scanning forces under the coupling deformation of atomic force microscope probeJ. Acta Physica Sinica, 2004, 53(3): 728-733. DOI: 10.7498/aps.53.728

Citation:

Zhang Xiang-Jun, Meng Yong-Gang, Wen Shi-Zhu. On micro scanning forces under the coupling deformation of atomic force microscope probeJ. Acta Physica Sinica, 2004, 53(3): 728-733. DOI: 10.7498/aps.53.728

Citation:

Zhang Xiang-Jun, Meng Yong-Gang, Wen Shi-Zhu. On micro scanning forces under the coupling deformation of atomic force microscope probeJ. Acta Physica Sinica, 2004, 53(3): 728-733. DOI: 10.7498/aps.53.728