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中国物理学会期刊
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LIU HONG-XIA, HAO YUE. STUDY ON STRESS INDEUCED LEAKAGE CURRENT TRANSIENT CHARACTERISTICS IN THIN GATE OXIDEJ. Acta Physica Sinica, 2001, 50(9): 1769-1773. DOI: 10.7498/aps.50.1769
Citation: LIU HONG-XIA, HAO YUE. STUDY ON STRESS INDEUCED LEAKAGE CURRENT TRANSIENT CHARACTERISTICS IN THIN GATE OXIDEJ. Acta Physica Sinica, 2001, 50(9): 1769-1773. DOI: 10.7498/aps.50.1769
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STUDY ON STRESS INDEUCED LEAKAGE CURRENT TRANSIENT CHARACTERISTICS IN THIN GATE OXIDE

Acta Phys. Sin., 2001, 50(9): 1769-1773.
DOI: 10.7498/aps.50.1769
CSTR: 32037.14.aps.50.1769
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