REN HONG-XIA, HAO YUE. STUDY ON THE HOT-CARRIER-DEGRADATION MECHANISM AND HOT-CARRIER-EFFECT IMMUNITY I N ADVANCED GROOVED-GATE PMOSFETJ. Acta Physica Sinica, 2000, 49(9): 1683-1688. DOI: 10.7498/aps.49.1683