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中国物理学会期刊
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LI MING, MAI ZHEN-HONG, CUI SHU-PAN. CHARACTERIZATION OF MICRO-DEFECTS IN SILICON SINGLE CRYSTALS BY ANALYZING THE PENDELL?SUNG FRINGESJ. Acta Physica Sinica, 1994, 43(1): 78-83. DOI: 10.7498/aps.43.78
Citation: LI MING, MAI ZHEN-HONG, CUI SHU-PAN. CHARACTERIZATION OF MICRO-DEFECTS IN SILICON SINGLE CRYSTALS BY ANALYZING THE PENDELL?SUNG FRINGESJ. Acta Physica Sinica, 1994, 43(1): 78-83. DOI: 10.7498/aps.43.78
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CHARACTERIZATION OF MICRO-DEFECTS IN SILICON SINGLE CRYSTALS BY ANALYZING THE PENDELL?SUNG FRINGES

Acta Phys. Sin., 1994, 43(1): 78-83.
DOI: 10.7498/aps.43.78
CSTR: 32037.14.aps.43.78
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