TEM STUDY OF MICROSTRUCTURAL CHANGES INDUCED BY AR ION IMPLANTATION IN YBa2Cu3O7-x SUPERCONDUCTING FILMS

LI YI-JIE; XIONG GUANG-CHENG; GAN ZI-ZHAO; REN CONG-XIN; ZOU SHI-CHANG

doi:10.7498/aps.42.482

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LI YI-JIE, XIONG GUANG-CHENG, GAN ZI-ZHAO, REN CONG-XIN, ZOU SHI-CHANG. TEM STUDY OF MICROSTRUCTURAL CHANGES INDUCED BY AR ION IMPLANTATION IN YBa2Cu3O7-x SUPERCONDUCTING FILMSJ. Acta Physica Sinica, 1993, 42(3): 482-487. DOI: 10.7498/aps.42.482

Citation:

LI YI-JIE, XIONG GUANG-CHENG, GAN ZI-ZHAO, REN CONG-XIN, ZOU SHI-CHANG. TEM STUDY OF MICROSTRUCTURAL CHANGES INDUCED BY AR ION IMPLANTATION IN YBa2Cu3O7-x SUPERCONDUCTING FILMSJ. Acta Physica Sinica, 1993, 42(3): 482-487. DOI: 10.7498/aps.42.482

Citation:

LI YI-JIE, XIONG GUANG-CHENG, GAN ZI-ZHAO, REN CONG-XIN, ZOU SHI-CHANG. TEM STUDY OF MICROSTRUCTURAL CHANGES INDUCED BY AR ION IMPLANTATION IN YBa2Cu3O7-x SUPERCONDUCTING FILMSJ. Acta Physica Sinica, 1993, 42(3): 482-487. DOI: 10.7498/aps.42.482