STUDY ON A PLANE-LIKE PRECIPITATE IN SILICON SINGLE CRYSTAL BY X-RAY TOPOGRAPHIC METHOD

CHU XI; MAI ZHEN-HONG; DAI DAO-YANG; CUI SHU-FAN; GE PEI-WEN

doi:10.7498/aps.36.408

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CHU XI, MAI ZHEN-HONG, DAI DAO-YANG, CUI SHU-FAN, GE PEI-WEN. STUDY ON A PLANE-LIKE PRECIPITATE IN SILICON SINGLE CRYSTAL BY X-RAY TOPOGRAPHIC METHODJ. Acta Physica Sinica, 1987, 36(3): 408-410. DOI: 10.7498/aps.36.408

Citation:

CHU XI, MAI ZHEN-HONG, DAI DAO-YANG, CUI SHU-FAN, GE PEI-WEN. STUDY ON A PLANE-LIKE PRECIPITATE IN SILICON SINGLE CRYSTAL BY X-RAY TOPOGRAPHIC METHODJ. Acta Physica Sinica, 1987, 36(3): 408-410. DOI: 10.7498/aps.36.408

Citation:

CHU XI, MAI ZHEN-HONG, DAI DAO-YANG, CUI SHU-FAN, GE PEI-WEN. STUDY ON A PLANE-LIKE PRECIPITATE IN SILICON SINGLE CRYSTAL BY X-RAY TOPOGRAPHIC METHODJ. Acta Physica Sinica, 1987, 36(3): 408-410. DOI: 10.7498/aps.36.408