STRUCTURE ANALYSIS OF Si(111)2×1 SURFACE AND THE EFFECT OF 1×1 DOMAIN WITH LOW-ENERGY ELECTRON DIFFRACTION

WU XUE-JUN; XU GENG; LIU HUI-ZHOU

doi:10.7498/aps.36.1401

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WU XUE-JUN, XU GENG, LIU HUI-ZHOU. STRUCTURE ANALYSIS OF Si(111)2×1 SURFACE AND THE EFFECT OF 1×1 DOMAIN WITH LOW-ENERGY ELECTRON DIFFRACTIONJ. Acta Physica Sinica, 1987, 36(11): 1401-1407. DOI: 10.7498/aps.36.1401

Citation:

WU XUE-JUN, XU GENG, LIU HUI-ZHOU. STRUCTURE ANALYSIS OF Si(111)2×1 SURFACE AND THE EFFECT OF 1×1 DOMAIN WITH LOW-ENERGY ELECTRON DIFFRACTIONJ. Acta Physica Sinica, 1987, 36(11): 1401-1407. DOI: 10.7498/aps.36.1401

Citation:

WU XUE-JUN, XU GENG, LIU HUI-ZHOU. STRUCTURE ANALYSIS OF Si(111)2×1 SURFACE AND THE EFFECT OF 1×1 DOMAIN WITH LOW-ENERGY ELECTRON DIFFRACTIONJ. Acta Physica Sinica, 1987, 36(11): 1401-1407. DOI: 10.7498/aps.36.1401