2003, 52(8): 1827-1831.
DOI: 10.7498/aps.52.1827
CSTR: 32037.14.aps.52.1827
2003, 52(8): 1832-1836.
DOI: 10.7498/aps.52.1832
CSTR: 32037.14.aps.52.1832
2003, 52(8): 1837-1841.
DOI: 10.7498/aps.52.1837
CSTR: 32037.14.aps.52.1837
LamDe' function and invariants of multi-order exact solutions among nonline ar evolution equations
2003, 52(8): 1842-1847.
DOI: 10.7498/aps.52.1842
CSTR: 32037.14.aps.52.1842
2003, 52(8): 1848-1857.
DOI: 10.7498/aps.52.1848
CSTR: 32037.14.aps.52.1848
2003, 52(8): 1858-1861.
DOI: 10.7498/aps.52.1858
CSTR: 32037.14.aps.52.1858
2003, 52(8): 1862-1866.
DOI: 10.7498/aps.52.1862
CSTR: 32037.14.aps.52.1862
2003, 52(8): 1867-1870.
DOI: 10.7498/aps.52.1867
CSTR: 32037.14.aps.52.1867
2003, 52(8): 1871-1876.
DOI: 10.7498/aps.52.1871
CSTR: 32037.14.aps.52.1871
2003, 52(8): 1877-1881.
DOI: 10.7498/aps.52.1877
CSTR: 32037.14.aps.52.1877
2003, 52(8): 1882-1890.
DOI: 10.7498/aps.52.1882
CSTR: 32037.14.aps.52.1882
2003, 52(8): 1891-1894.
DOI: 10.7498/aps.52.1891
CSTR: 32037.14.aps.52.1891
2003, 52(8): 1895-1900.
DOI: 10.7498/aps.52.1895
CSTR: 32037.14.aps.52.1895
2003, 52(8): 1901-1905.
DOI: 10.7498/aps.52.1901
CSTR: 32037.14.aps.52.1901
2003, 52(8): 1906-1910.
DOI: 10.7498/aps.52.1906
CSTR: 32037.14.aps.52.1906
2003, 52(8): 1911-1915.
DOI: 10.7498/aps.52.1911
CSTR: 32037.14.aps.52.1911
2003, 52(8): 1916-1919.
DOI: 10.7498/aps.52.1916
CSTR: 32037.14.aps.52.1916
2003, 52(8): 1920-1924.
DOI: 10.7498/aps.52.1920
CSTR: 32037.14.aps.52.1920
2003, 52(8): 1925-1928.
DOI: 10.7498/aps.52.1925
CSTR: 32037.14.aps.52.1925
2003, 52(8): 1929-1933.
DOI: 10.7498/aps.52.1929
CSTR: 32037.14.aps.52.1929
2003, 52(8): 1934-1937.
DOI: 10.7498/aps.52.1934
CSTR: 32037.14.aps.52.1934
2003, 52(8): 1938-1942.
DOI: 10.7498/aps.52.1938
CSTR: 32037.14.aps.52.1938
Finite difference time domain method for the study of band gap in two-dimensiona l phononic crystals
2003, 52(8): 1943-1947.
DOI: 10.7498/aps.52.1943
CSTR: 32037.14.aps.52.1943
2003, 52(8): 1948-1953.
DOI: 10.7498/aps.52.1948
CSTR: 32037.14.aps.52.1948
2003, 52(8): 1960-1964.
DOI: 10.7498/aps.52.1960
CSTR: 32037.14.aps.52.1960
2003, 52(8): 1970-1978.
DOI: 10.7498/aps.52.1970
CSTR: 32037.14.aps.52.1970
2003, 52(8): 1984-1992.
DOI: 10.7498/aps.52.1984
CSTR: 32037.14.aps.52.1984
2003, 52(8): 1993-1999.
DOI: 10.7498/aps.52.1993
CSTR: 32037.14.aps.52.1993
Effect of nitrogen on oxygen precipitation in Czochralski silicon during high-te mperature annealing
2003, 52(8): 2000-2004.
DOI: 10.7498/aps.52.2000
CSTR: 32037.14.aps.52.2000
2003, 52(8): 2005-2009.
DOI: 10.7498/aps.52.2005
CSTR: 32037.14.aps.52.2005
2003, 52(8): 2010-2014.
DOI: 10.7498/aps.52.2010
CSTR: 32037.14.aps.52.2010
2003, 52(8): 2015-2019.
DOI: 10.7498/aps.52.2015
CSTR: 32037.14.aps.52.2015
2003, 52(8): 2020-2026.
DOI: 10.7498/aps.52.2020
CSTR: 32037.14.aps.52.2020
2003, 52(8): 2033-2036.
DOI: 10.7498/aps.52.2033
CSTR: 32037.14.aps.52.2033
2003, 52(8): 2037-2040.
DOI: 10.7498/aps.52.2037
CSTR: 32037.14.aps.52.2037
2003, 52(8): 2041-2045.
DOI: 10.7498/aps.52.2041
CSTR: 32037.14.aps.52.2041
2003, 52(8): 2046-2051.
DOI: 10.7498/aps.52.2046
CSTR: 32037.14.aps.52.2046
2003, 52(8): 2052-2056.
DOI: 10.7498/aps.52.2052
CSTR: 32037.14.aps.52.2052
2003, 52(8): 2057-2060.
DOI: 10.7498/aps.52.2057
CSTR: 32037.14.aps.52.2057
2003, 52(8): 2061-2065.
DOI: 10.7498/aps.52.2061
CSTR: 32037.14.aps.52.2061
2003, 52(8): 2066-2074.
DOI: 10.7498/aps.52.2066
CSTR: 32037.14.aps.52.2066
2003, 52(8): 2075-2080.
DOI: 10.7498/aps.52.2075
CSTR: 32037.14.aps.52.2075
2003, 52(8): 2081-2086.
DOI: 10.7498/aps.52.2081
CSTR: 32037.14.aps.52.2081
2003, 52(8): 2087-2091.
DOI: 10.7498/aps.52.2087
CSTR: 32037.14.aps.52.2087
2003, 52(8): 2092-2095.
DOI: 10.7498/aps.52.2092
CSTR: 32037.14.aps.52.2092
2003, 52(8): 2102-2104.
DOI: 10.7498/aps.52.2102
CSTR: 32037.14.aps.52.2102


