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Band offsets of ZnO/PbTe heterostructure determined by synchrotron radiation photoelectron spectroscopy

Cai Chun-Feng Zhang Bing-Po Li Rui-Feng Xu Tian-Ning Bi Gang Wu Hui-Zhen Zhang Wen-Hua Zhu Jun-Fa

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Band offsets of ZnO/PbTe heterostructure determined by synchrotron radiation photoelectron spectroscopy

Cai Chun-Feng, Zhang Bing-Po, Li Rui-Feng, Xu Tian-Ning, Bi Gang, Wu Hui-Zhen, Zhang Wen-Hua, Zhu Jun-Fa
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  • Accurate determination of the band offsets of a heterostructure is essential to its study and application. In this paper, we use synchrotron radiation photoelectron spectroscopy to determine the band offset of ZnO/PbTe heterostructure. The valence band offset is 2.56 eV, and the conduction band offset is 0.49 eV, which indicates that the heterostructure has a type-I band alignment. By performing the depth scanning measurement, we find there are two bonding structures at the interface of ZnO/PbTe heterostructure, corresponding to Pb-O bonding (low energy side) and Pb-Te bonding (high energy side). At the interface of ZnO/PbTe heterostructure, the conduction band offset is much smaller than the valence band offset which is conducive to the transportation of excited electrons in PbTe source layer to ZnO electrode. Due to the unique band structure the ZnO/PbTe heterostructure has potential applications in the fabrication of high efficiency solar cells, mid infrared detectors and lasers.
    • Funds: Project supported by the National Natural Science Foundation of China (Grant Nos. 61275108, 11374259).
    [1]

    Levin E M, Heremans J P, Kanatzidis M G, Schmidt-Rohr K 2013 Phys. Rev. B 88 115211

    [2]

    Wu H F, Zhang H J, Liao Q, Lu Y H, Si J X, Li H Y, Bao S N, Wu H Z, He P M 2009 Acta Phys. Sin. 58 1310 (in Chinese) [吴海飞, 张寒洁, 廖清, 陆赟豪, 斯剑霄, 李海洋, 鲍世宁, 吴惠祯, 何丕模 2009 58 1310]

    [3]

    Xu T N, Wu H Z, Sui C H 2008 Acta Phys. Sin. 57 7865 (in Chinese) [徐天宁, 吴惠桢, 隋成华 2008 57 7865]

    [4]

    Jin S Q, Cai C F, Bi G, Zhang B P, Wu H Z, Zhang Y 2013 Phys. Rev. B 87 235315

    [5]

    Ishida A, SugiyamaY, Isaji Y, Kodama K, Takano Y, Sakata H, Rahim M, Khiar A, Fill M, Felder F, Zogg H 2011 Appl. Phys. Lett. 99 121109

    [6]

    Lin Z H, Wang M Q, Zhang L Y, Xue Y H, Yao X, Cheng H W, Bai J T 2012 J. Mater. Chem. 22 9082

    [7]

    Wei X D, Cai C F, Zhang B P, Hu L, Wu H Z, Zhang Y G, Feng J W, Lin J M, Lin C, Fang W Z, Dai N 2011 J. Infrared Millim. Waves 30 293 (in Chinese) [魏晓东, 蔡春锋, 张兵坡, 胡炼, 吴惠桢, 张永刚, 冯靖文, 林加木, 林春, 方维政, 戴宁 2011 红外与毫米波学报 30 293]

    [8]

    Kolwas K A, Grabecki G, Trushkin S, Wrobel J, Aleszkiewicz M, Cywinski L, Dietl T, Springholz G, Bauer G 2013 Phys. Status Solidi B 250 37

    [9]

    Fu H Y, Tsang S W 2012 Nanoscale 4 2187

    [10]

    Cai C F, Wu H Z, Si J X, Sun Y, Dai N 2009 Acta Phys. Sin. 58 3560 (in Chinese) [蔡春锋, 吴惠桢, 斯剑霄, 孙艳, 戴宁 2009 58 3560]

    [11]

    Rahim M, Khiar A, Felder F, Fill M, Zogg H, Sigrist M W 2010 Appl. Phys. B 100 261

    [12]

    Hou Q Y, Liu Q L, Zhao C W, Zhao E J 2014 Acta Phys. Sin. 63 057101 (in Chinese) [侯清玉, 刘全龙, 赵春旺, 赵二俊 2014 63 057101]

    [13]

    Cho Y S, Kang J W, Kim B H, Park S J 2013 Opt. Express 21 31560

    [14]

    Santos J D, Fernandez S, Carabe J, Gandia J J 2014 Thin Solid Films 551 207

    [15]

    He J F, Zheng S K, Zhou P L, Shi R Q, Yan X B 2014 Acta Phys. Sin. 63 046301 (in Chinese) [何静芳, 郑树凯, 周鹏力, 史茹倩, 闫小兵 2014 63 046301]

    [16]

    Zhitomirsky D, Furukawa M, Tang J, Stadler P, Hoogland S, Voznyy O, Liu H, Sargent E H 2012 Adv. Mater. 24 6181

    [17]

    Choi J J, Lim Y F, Santiago-Berrios M B, Oh M, Hyun B R, Sun L F, Bartnik A C, Goedhart A, Malliaras G G, Abruña H D, Wise F W, Hanrath T 2009 Nano Lett. 9 3749

    [18]

    Timp B A, Zhu X Y 2010 Surface Sci. 604 1335

    [19]

    Li L, Qiu J J, Weng B B, Yuan Z J, Li X M, Gan X Y, Sellers I R, Shi Z S 2012 Appl. Phys. Lett. 101 261601

    [20]

    Cai C F, Zhang B P, Li R F, Wu H Z, Xu T N, Zhang W H, Zhu J F 2012 Europhys. Lett. 99 37010

    [21]

    Zou C, Sun B, Zhang W, Wang G, Xu P, Wang P Q, Xu F, Pan H 2005 Nucl. Instrum. Meth. A 548 574

    [22]

    Kraut E A, Grant R W, Waldrop J R, Kowalczyk S P 1980 Phys. Rev. Lett. 44 1620

    [23]

    Cai C F, Wu H Z, Si J X, Jin S Q, Zhang W H, Xu Y, Zhu J F 2010 Chin. Phys. B 19 077301

    [24]

    Cai C F, Wu H Z, Si J X, Zhang W H, Xu Y, Zhu J F 2010 Appl.Surf.Sci. 256 6057

    [25]

    Si J X, Jin S Q, Zhang H J, Zhu P, Qiu D J, Wu H Z 2008 Appl. Phys. Lett. 93 202101

    [26]

    McFeely F R, Kowalczyk S, Ley L, Pollak R A, Shirley D A 1973 Phys. Rev. B 7 5228

    [27]

    Chen Q, Yang M, Feng Y P, Chai J W, Zhang Z, Pan J S, Wang S J 2009 Appl. Phys. Lett. 95 162104

  • [1]

    Levin E M, Heremans J P, Kanatzidis M G, Schmidt-Rohr K 2013 Phys. Rev. B 88 115211

    [2]

    Wu H F, Zhang H J, Liao Q, Lu Y H, Si J X, Li H Y, Bao S N, Wu H Z, He P M 2009 Acta Phys. Sin. 58 1310 (in Chinese) [吴海飞, 张寒洁, 廖清, 陆赟豪, 斯剑霄, 李海洋, 鲍世宁, 吴惠祯, 何丕模 2009 58 1310]

    [3]

    Xu T N, Wu H Z, Sui C H 2008 Acta Phys. Sin. 57 7865 (in Chinese) [徐天宁, 吴惠桢, 隋成华 2008 57 7865]

    [4]

    Jin S Q, Cai C F, Bi G, Zhang B P, Wu H Z, Zhang Y 2013 Phys. Rev. B 87 235315

    [5]

    Ishida A, SugiyamaY, Isaji Y, Kodama K, Takano Y, Sakata H, Rahim M, Khiar A, Fill M, Felder F, Zogg H 2011 Appl. Phys. Lett. 99 121109

    [6]

    Lin Z H, Wang M Q, Zhang L Y, Xue Y H, Yao X, Cheng H W, Bai J T 2012 J. Mater. Chem. 22 9082

    [7]

    Wei X D, Cai C F, Zhang B P, Hu L, Wu H Z, Zhang Y G, Feng J W, Lin J M, Lin C, Fang W Z, Dai N 2011 J. Infrared Millim. Waves 30 293 (in Chinese) [魏晓东, 蔡春锋, 张兵坡, 胡炼, 吴惠桢, 张永刚, 冯靖文, 林加木, 林春, 方维政, 戴宁 2011 红外与毫米波学报 30 293]

    [8]

    Kolwas K A, Grabecki G, Trushkin S, Wrobel J, Aleszkiewicz M, Cywinski L, Dietl T, Springholz G, Bauer G 2013 Phys. Status Solidi B 250 37

    [9]

    Fu H Y, Tsang S W 2012 Nanoscale 4 2187

    [10]

    Cai C F, Wu H Z, Si J X, Sun Y, Dai N 2009 Acta Phys. Sin. 58 3560 (in Chinese) [蔡春锋, 吴惠桢, 斯剑霄, 孙艳, 戴宁 2009 58 3560]

    [11]

    Rahim M, Khiar A, Felder F, Fill M, Zogg H, Sigrist M W 2010 Appl. Phys. B 100 261

    [12]

    Hou Q Y, Liu Q L, Zhao C W, Zhao E J 2014 Acta Phys. Sin. 63 057101 (in Chinese) [侯清玉, 刘全龙, 赵春旺, 赵二俊 2014 63 057101]

    [13]

    Cho Y S, Kang J W, Kim B H, Park S J 2013 Opt. Express 21 31560

    [14]

    Santos J D, Fernandez S, Carabe J, Gandia J J 2014 Thin Solid Films 551 207

    [15]

    He J F, Zheng S K, Zhou P L, Shi R Q, Yan X B 2014 Acta Phys. Sin. 63 046301 (in Chinese) [何静芳, 郑树凯, 周鹏力, 史茹倩, 闫小兵 2014 63 046301]

    [16]

    Zhitomirsky D, Furukawa M, Tang J, Stadler P, Hoogland S, Voznyy O, Liu H, Sargent E H 2012 Adv. Mater. 24 6181

    [17]

    Choi J J, Lim Y F, Santiago-Berrios M B, Oh M, Hyun B R, Sun L F, Bartnik A C, Goedhart A, Malliaras G G, Abruña H D, Wise F W, Hanrath T 2009 Nano Lett. 9 3749

    [18]

    Timp B A, Zhu X Y 2010 Surface Sci. 604 1335

    [19]

    Li L, Qiu J J, Weng B B, Yuan Z J, Li X M, Gan X Y, Sellers I R, Shi Z S 2012 Appl. Phys. Lett. 101 261601

    [20]

    Cai C F, Zhang B P, Li R F, Wu H Z, Xu T N, Zhang W H, Zhu J F 2012 Europhys. Lett. 99 37010

    [21]

    Zou C, Sun B, Zhang W, Wang G, Xu P, Wang P Q, Xu F, Pan H 2005 Nucl. Instrum. Meth. A 548 574

    [22]

    Kraut E A, Grant R W, Waldrop J R, Kowalczyk S P 1980 Phys. Rev. Lett. 44 1620

    [23]

    Cai C F, Wu H Z, Si J X, Jin S Q, Zhang W H, Xu Y, Zhu J F 2010 Chin. Phys. B 19 077301

    [24]

    Cai C F, Wu H Z, Si J X, Zhang W H, Xu Y, Zhu J F 2010 Appl.Surf.Sci. 256 6057

    [25]

    Si J X, Jin S Q, Zhang H J, Zhu P, Qiu D J, Wu H Z 2008 Appl. Phys. Lett. 93 202101

    [26]

    McFeely F R, Kowalczyk S, Ley L, Pollak R A, Shirley D A 1973 Phys. Rev. B 7 5228

    [27]

    Chen Q, Yang M, Feng Y P, Chai J W, Zhang Z, Pan J S, Wang S J 2009 Appl. Phys. Lett. 95 162104

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Publishing process
  • Received Date:  11 March 2014
  • Accepted Date:  15 April 2014
  • Published Online:  05 August 2014

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