压缩应变载荷下氮化镓隧道结微观压电特性及其巨压电电阻效应

张耿鸿; 朱佳; 姜格蕾; 王彪; 郑跃

doi:10.7498/aps.65.107701

摘要

电子器件可控性研究在日益追求器件智能化和可控化的当今社会至关重要. 基于第一性原理和量子输运计算, 本文研究了压缩应变载荷对氮化镓(GaN)隧道结基态电学性质和电流输运的影响, 在原子尺度上窥视了氮化镓隧道结的微观压电性, 验证了其内在的巨压电电阻(GPR)效应. 计算结果表明, 压缩应变载荷可以调节隧道结内氮化镓势垒层的电势能降、内建电场、电荷密度和极化强度, 进而实现对隧道结电流输运和隧穿电阻的调控. 在-1.0 V的偏置电压下, -5%的压缩应变载荷将使氮化镓隧道结的隧穿电阻增至4倍. 本研究展现了氮化镓隧道结在可控电子器件中的应用潜力, 也展现了应变工程在调控电子器件性能方面的光明前景.

关键词:

Abstract

It is an urgent and significant issue to investigate the influence factors of functional devices and then improve, modify or control their performances, which has important significance for the practical application and electronic industry. Based on first principle and quantum transport calculations, the effects of compressive strain on the current transport and relative electrical properties (such as the electrostatic potential energy, built-in electric field, charge density and polarization, etc.) in gallium nitride (GaN) tunnel junctions are investigated. It is found that there are potential energy drop, built-in electric field and spontaneous polarization in the GaN barrier of the tunnel junction due to the non-centrosymmetric structure of GaN. Furthermore, results also show that all these electrical properties can be adjusted by compressive strain. With the increase of the applied in-plane compressive strain, the piezocharge density in the GaN barrier of the tunnel junction gradually increases. Accordingly, the potential energy drop throughout the GaN barrier gradually flattens and the built-in electric field decreases. Meanwhile, the average polarization of the barrier is weakened and even reversed. These strain-dependent evolutions of the electric properties also provide an atomic level insight into the microscopic piezoelectricity of the GaN tunnel junction. In addition, it is inspiring to see that the current transport as well as the tunneling resistance of the GaN tunnel junction can be well tuned by the compressive strain. When the applied compressive strain decreases, the tunneling current of the junction increases and the tunneling resistance decreases. This strain control ability on the tunnel junctions current and resistance becomes more powerful at large bias voltages. At a bias voltage of -1.0 V, the tunneling resistance can increase up to 4 times by a -5% compressive strain, which also reveals the intrinsic giant piezoelectric resistance effect in the GaN tunnel junction. This study exhibits the potential applications of GaN tunnel junctions in tunable electronic devices and also implies the promising prospect of strain engineering in the field of exploiting tunable devices.

Keywords:

作者及机构信息

1.
中山大学物理科学与工程技术学院, 微纳物理力学实验室, 广州 510275;

2.
中山大学光电材料与技术国家重点实验室, 广州 510275;

3.
中山大学中法核工程与技术学院, 珠海 519082

通信作者: 王彪, wangbiao@mail.sysu.edu.cn;zhengy35@mail.sysu.edu.cn

基金项目: 中国博士后科学基金(批准号:2014M552267)和高等学校博士学科点专项科研基金(批准号:20110171110022)资助的课题.

Authors and contacts

1.
Micro-Nano Physics and Mechanics Research Laboratory, School of Physics and Engineering, Sun Yat-sen University, Guangzhou 510275, China;

2.
State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-sen University, Guangzhou 510275, China;

3.
Institute Franco-Chinois de l’Energie Nucléaire, Sun Yat-sen University, Zhuhai 519082, China

Corresponding author: Wang Biao, wangbiao@mail.sysu.edu.cn;zhengy35@mail.sysu.edu.cn

Funds: Project supported by the China Postdoctoral Science Foundation (Grant No. 2014M552267) and the Specialized Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20110171110022).

参考文献

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[23]	Yu R M, Wang X F, Peng W B, Wu W Z, Ding Y, Li S T, Wang Z L 2015 ACS Nano 9 9822
[24]	Zhao Z F, Pu X, Han C B, Du C H, Li L X, Jiang C Y, Hu W G, Wang Z L 2015 ACS Nano 9 8578
[25]	Wang C H, Liao W S, Ku N J, Li Y C, Chen Y C, Tu L W, Liu C P 2014 Small 10 4718
[26]	Jiao Q Q, Chen Z Z, Ma J, Wang S Y, Li Y, Jiang S, Feng Y L, Li J Z, Chen Y F, Yu T J, Wang S F, Zhang G Y, Tian P F, Xie E Y, Gong Z, Gu E D, Dawson M D 2015 Opt. Express 23 237856
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[40]	Datta S 1997 Electronic Transport in Mesoscopic Systems (Cambridge: Cambridge University Press) pp102-112

施引文献

[1]	Strite S, Morko H 1992 J. Vac. Sci. Technol. B 10 1237
[2]	Ambacher O 1998 J. Phys. D: Appl. Phys. 31 2653
[3]	Liou J K, Chen C C, Chou P C, Tsai Z J, Chang Y C, Liu W C 2014 IEEE J. Quantum Elect. 50 973
[4]	Zhao L X, Yu Z G, Sun B, Zhu S C, An P B, Yang C, Liu L, Wang J X, Li J M 2015 Chin. Phys. B 24 068506
[5]	Wu Y F, Saxler A, Moore M, Smith R P, Sheppard S, Chavarkar P M, Wisleder T, Mishra U K, Parikh P 2004 IEEE Elect. Device Lett. 25 117
[6]	Higashiwaki M, Mimura T, Matsui T 2008 Appl. Phys. Express 1 021103
[7]	Zheng Y, Woo C H 2009 Nanotechnology 20 075401
[8]	Luo X, Wang B, Zheng Y 2011 ACS Nano 5 1649
[9]	Zhang G H, Luo X, Zheng Y, Wang B 2012 Phys. Chem. Chem. Phys. 14 7051
[10]	Yang Y, Qi J J, Gu Y S, Wang X Q, Zhang Y 2009 Phys. Status Solidi RRL 3 269
[11]	Wang Z L 2007 Adv. Mater. 19 889
[12]	Zhou J, Fei P, Gu Y D, Mai W J, Gao Y F, Yang R S, Bao G, Wang Z L 2008 Nano Lett. 8 3973
[13]	Zhang Y, Liu Y, Wang Z L 2011 Adv. Mater. 23 3004
[14]	Feng X L, Zhang Y, Wang Z L 2013 Sci. China Tech. Sci. 56 2615
[15]	Liu Y, Zhang Y, Yang Q, Niu S M, Wang Z L 2015 Nano Energy 14 257
[16]	Jiao Z Y, Yang J F, Zhang X Z, Ma S H, Guo Y L 2011 Acta Phys. Sin. 60 117103 (in Chinese) [焦照勇, 杨继飞, 张现周, 马淑红, 郭永亮 2011 60 117103]
[17]	Yang Z Q, Xu Z Z 1997 Acta Phys. Sin. (Overseas Edition) 6 606
[18]	Hao G D, Chen Y H, Fan Y M, Huang X H, Wang H B 2010 Chin. Phys. B 19 117104
[19]	Agrawal R, Espinosa H D 2011 Nano Lett. 11 786
[20]	Zhang J, Wang C Y, Chowdhury R, Adhikari S 2013 Scripta Mater. 68 627
[21]	Yu R M, Dong L, Pan C F, Niu S M, Liu H F, Liu W, Chua S, Chi D Z, Wang Z L 2012 Adv. Mater. 24 3532
[22]	Yu R M, Wu W Z, Ding Y, Wang Z L 2013 ACS Nano 7 6403
[23]	Yu R M, Wang X F, Peng W B, Wu W Z, Ding Y, Li S T, Wang Z L 2015 ACS Nano 9 9822
[24]	Zhao Z F, Pu X, Han C B, Du C H, Li L X, Jiang C Y, Hu W G, Wang Z L 2015 ACS Nano 9 8578
[25]	Wang C H, Liao W S, Ku N J, Li Y C, Chen Y C, Tu L W, Liu C P 2014 Small 10 4718
[26]	Jiao Q Q, Chen Z Z, Ma J, Wang S Y, Li Y, Jiang S, Feng Y L, Li J Z, Chen Y F, Yu T J, Wang S F, Zhang G Y, Tian P F, Xie E Y, Gong Z, Gu E D, Dawson M D 2015 Opt. Express 23 237856
[27]	Hertog M D, Songmuang R, Gonzalez-Posada F, Monroy E 2013 Jpn. J. Appl. Phys. 52 11NG01
[28]	Kamiya T, Tajima K, Nomura K, Yanagi H, Hosono H 2008 Phys. Status Solidi A 205 1929
[29]	Kresse G, Furthmller J 1996 Phys. Rev. B 54 11169
[30]	Perdew J P, Burke K, Ernzerhof M 1996 Phys. Rev. Lett. 77 3865
[31]	Blchl P E 1994 Phys. Rev. B 50 17953
[32]	Monkhorst H J, Pack J D 1976 Phys. Rev. B 13 5188
[33]	Brandbyge M, Mozos J L, Ordejn P, Taylor J, Stokbro K 2002 Phys. Rev. B 65 165401
[34]	Payne M C, Teter M P, Allan D C, Arias T A, Joannopoulos J D 1992 Rev. Mod. Phys. 64 1045
[35]	Soler J M, Artacho E, Gale J D, Garca A, Junquera J, Ordejn P, Snchez-Portal D 2002 J. Phys.: Condens. Matter 14 2745
[36]	Junquera J, Cohen M H, Rabe K M 2007 J. Phys.: Condens. Matter 19 213203
[37]	Zhang G H, Zheng Y, Wang B 2013 J. Appl. Lett. 114 044111
[38]	Liu W, Zhang A H, Zhang Y, Wang Z L 2015 Nano Energy 14 355
[39]	Gonze X, Lee C 1997 Phys. Rev. B 55 10355
[40]	Datta S 1997 Electronic Transport in Mesoscopic Systems (Cambridge: Cambridge University Press) pp102-112

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