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Through improvement of Hall probe cryogenic calibration system, a cryogenic remanence measurement system(CRMS) for chunk permanent magnet was built. With a rectangular NdFeB(N50M) permanent magnet (its size is 40 mm×40 mm×10 mm) as example, cryogenic remanence measurement technology for chunk permanent magnet was studied. Results show that main factors affecting cryogenic remanence measurement reliability are Hall probe cryogenic calibration, Hall probe location, temperature drift, and thermal expansion of the material and so on. If the same methods are used for measurement, then the cryogenic remanence measurement repeatability of a permanent magnet is less than 0.1%. The experimental study creates conditions for measurements and research of cryogenic remanence of chunk permanent magnet of high-precision permanent magnet devices, such as cryogenic undulators.
[1] Zhou S Z, Dong Q F 1999 Super permanent magnet (Beijing: Metallurgical Industry Press) p 145 [周寿增, 董清飞 1999 超强永磁体(北京: 冶金工业出版社) 第145页]
[2] Chen H Y 2000 Modern Instruments 5 7 (in Chinese) [陈海英 2000 现代仪器 5 7]
[3] Wang F W, Zhang P L, Shen B G,Yan Q W 2004 Chin. Phys. 13 0918
[4] He Y Z, Zhou Q G 2013 Acta Phys. Sin. 62 044106 (in Chinese) [何永周, 周巧根 2013 62 044106]
[5] He Y Z, Zhang J D, Zhou Q G, Qian Z M, Li Y 2010 AIP Conf. Proc. 1234 527
[6] Hara T, Tanaka T, Kitamura H 2004 Phys. Rev. 7 9
[7] Chavanne J, Lebec G, Penel C, Revol F 2010 AIP Conf Proc. 1234 25
[8] Tanaka T, Seike T, Kagamihata A, Schmidt T, Anghel A, Brgger M, Bulgheroni W, Jakob B, Kitamura H 2009 Phys. Rev. 12 1
[9] He Y Z 2013 Acta Phys. Sin. 62 084105 (in Chinese) [何永周 2013 62 084105]
[10] Zhao K H, Chen X M 2003 Electromagnetism (Beijing: Higher Education Press) p92 [赵凯华, 陈熙谋 2003 电磁学(北京: 高等教育出版社) 第92页]
[11] He Y Z 2013 Chin. Phys. B 22 074101
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[1] Zhou S Z, Dong Q F 1999 Super permanent magnet (Beijing: Metallurgical Industry Press) p 145 [周寿增, 董清飞 1999 超强永磁体(北京: 冶金工业出版社) 第145页]
[2] Chen H Y 2000 Modern Instruments 5 7 (in Chinese) [陈海英 2000 现代仪器 5 7]
[3] Wang F W, Zhang P L, Shen B G,Yan Q W 2004 Chin. Phys. 13 0918
[4] He Y Z, Zhou Q G 2013 Acta Phys. Sin. 62 044106 (in Chinese) [何永周, 周巧根 2013 62 044106]
[5] He Y Z, Zhang J D, Zhou Q G, Qian Z M, Li Y 2010 AIP Conf. Proc. 1234 527
[6] Hara T, Tanaka T, Kitamura H 2004 Phys. Rev. 7 9
[7] Chavanne J, Lebec G, Penel C, Revol F 2010 AIP Conf Proc. 1234 25
[8] Tanaka T, Seike T, Kagamihata A, Schmidt T, Anghel A, Brgger M, Bulgheroni W, Jakob B, Kitamura H 2009 Phys. Rev. 12 1
[9] He Y Z 2013 Acta Phys. Sin. 62 084105 (in Chinese) [何永周 2013 62 084105]
[10] Zhao K H, Chen X M 2003 Electromagnetism (Beijing: Higher Education Press) p92 [赵凯华, 陈熙谋 2003 电磁学(北京: 高等教育出版社) 第92页]
[11] He Y Z 2013 Chin. Phys. B 22 074101
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