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This paper proposes to use minus peak time of second derivative with respect to time on logarithmic curve of temperature versus time as a characteristic time for defect depth prediction in pulsed wave thermography. First, the paper introduces the basic principle of pulsed wave thermography, and constructs the theoretical relation between logarithmic minus peak second derivative time and the square of defect depth based on the solution of semi-infinite body. Then, two specimens of steel and aluminum were manufactured with flat-bottom holes to simulate defects. Thermographic image sequences of those two specimens were obtained by using pulsed wave thermography, and then the logarithmic minus peak second derivative time were extracted. The extracted characteristic time has a very good linearity relation with the square of defect depth, and this linearity could be used for defect depth prediction in practical applications. The advantages and disadvantages of the proposed method and the widely used logarithmic peak second derivative method are discussed.
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Keywords:
- pulsed wave thermography /
- quantitative characterization /
- defect depth /
- minus peak
[1] Shepard S M, Hou Y, Lhota J 2004 CD-ROM proceedings of the 16th world conference on NDT, Aug 30-Sep 3, 2004 791
[2] Chen D P, Zeng Z, Zhang C L, Jin X Y, Zhang Z 2012 Acta Phys. Sin. 61 094207 (in Chinese) [陈大鹏, 曾智, 张存林, 金学元, 张峥 2012 61 094207]
[3] Huo Y, Zhang C L 2012 Acta Phys. Sin. 61 144204 (in Chinese) [霍雁, 张存林 2012 61 144204]
[4] Zeng Z, Li C G, Tao N, Feng L C, Zhang C L 2012 NDT &E International 48 39
[5] Favro L D, Jin H J, Wang Y X, Ahmed T, Wang X 1991 Review of progress in quantitative nondestructive evaluation. Proceedings of the 18th Annual Review, Brunswick, ME, July 28-Aug. 2, 1991, p447
[6] Ringermacher H I, Archacki Jr. R J, Veronesi W A 1998 U. S. Patent No. 5,711 603 [2008]
[7] Han X Y, Favro L D, Thomas R L 1998 the Second Joint NASA/FAA/DOD Conference on Aging Aircraft NASA/CP-1999-208982 Part 1 1998 p265
[8] Zeng Z, Zhou J, Tao N, Feng L C, Zhang C L 2012 Infrared physics and technology 55 200-4
[9] Zeng Z, Tao N, Feng L C, Zhang C L 2012 J. Appl. Phys. 112 023112
[10] Shepard S M, Lhota J R, Rubadeux B A, Wang D 2003 Opt. Eng. 42 1337
[11] Tao N, Zeng Z, Feng L C, Zhang C L 2012 Acta Phys. Sin. 61 174212 (in Chinese) [陶宁, 曾智, 冯立春, 张存林 2012 61 174212]
[12] Sun J G 2008 U. S. Patent No. 6,542 849 [2003]
[13] Maldague X P, Marinetti S 1996 J. Appl. Phys. 79 2694
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[1] Shepard S M, Hou Y, Lhota J 2004 CD-ROM proceedings of the 16th world conference on NDT, Aug 30-Sep 3, 2004 791
[2] Chen D P, Zeng Z, Zhang C L, Jin X Y, Zhang Z 2012 Acta Phys. Sin. 61 094207 (in Chinese) [陈大鹏, 曾智, 张存林, 金学元, 张峥 2012 61 094207]
[3] Huo Y, Zhang C L 2012 Acta Phys. Sin. 61 144204 (in Chinese) [霍雁, 张存林 2012 61 144204]
[4] Zeng Z, Li C G, Tao N, Feng L C, Zhang C L 2012 NDT &E International 48 39
[5] Favro L D, Jin H J, Wang Y X, Ahmed T, Wang X 1991 Review of progress in quantitative nondestructive evaluation. Proceedings of the 18th Annual Review, Brunswick, ME, July 28-Aug. 2, 1991, p447
[6] Ringermacher H I, Archacki Jr. R J, Veronesi W A 1998 U. S. Patent No. 5,711 603 [2008]
[7] Han X Y, Favro L D, Thomas R L 1998 the Second Joint NASA/FAA/DOD Conference on Aging Aircraft NASA/CP-1999-208982 Part 1 1998 p265
[8] Zeng Z, Zhou J, Tao N, Feng L C, Zhang C L 2012 Infrared physics and technology 55 200-4
[9] Zeng Z, Tao N, Feng L C, Zhang C L 2012 J. Appl. Phys. 112 023112
[10] Shepard S M, Lhota J R, Rubadeux B A, Wang D 2003 Opt. Eng. 42 1337
[11] Tao N, Zeng Z, Feng L C, Zhang C L 2012 Acta Phys. Sin. 61 174212 (in Chinese) [陶宁, 曾智, 冯立春, 张存林 2012 61 174212]
[12] Sun J G 2008 U. S. Patent No. 6,542 849 [2003]
[13] Maldague X P, Marinetti S 1996 J. Appl. Phys. 79 2694
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