The transmitting and reflecting optical microscopy has been used in the electrolytic polishing process for monitoring the polished specimen to obtain the optimum polishing condition. The intermittent current device has been employed in the electric circuit so that the control of the polishing condition becomes more feasible. The efficiency and reproducibility of specieen preparation have been improved. The transmission electron microscopy specimen of some superconducting and amorphous materials have been pre-pared by this technique and the electron microscopy and selected area electron diffrac-tion observations have been made.