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中国物理学会期刊

新型贮存式氧化物阴极寿命机理的初步探讨

CSTR: 32037.14.aps.58.1280

Lifetime of a new type of reservoir oxide cathode

CSTR: 32037.14.aps.58.1280
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  • 对一种新型贮存式氧化物阴极及一种普通氧化物阴极进行了寿命实验,采用XPS分析技术对这两种阴极寿命中不同涂层深度的Ba浓度进行对比分析,结合新型贮存式阴极结构及贮存发射材料的性质对这种阴极的寿命机理进行了探讨.结果表明,新型贮存式氧化物阴极的寿命是普通氧化物阴极的7倍,同时发现新型贮存式氧化物阴极涂层深处保持稳定Ba浓度是其具有长寿命的关键.

     

    The lifetime of a new type of reservoir oxide cathode and a conventional oxide cathode was experimentally studied. Concentrations of Ba in different coating depths of the cathodes were analysed by XPS during the lifetime testing process. The mechanism of the reservoir oxide cathode lifetime was discussed according to the analysis results, the cathode structures and the characteristics of the reservoir emission materials. The results show that the lifetime of the reservoir oxide cathode is about seven times that of the conventional oxide cathode. Ba concentration keeps steady in the depth of cathode coating, which plays an important role in the long lifetime of the reservoir oxide cathode.

     

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