fcc金属层错能的EAM法计算 -

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fcc金属层错能的EAM法计算

, 2006, 55(1): 393-397.

DOI: 10.7498/aps.55.393

CSTR: 32037.14.aps.55.393

Energy calculation of the stacking fault in fcc metals by embedded-atom method

Acta Phys. Sin., 2006, 55(1): 393-397.

DOI: 10.7498/aps.55.393

CSTR: 32037.14.aps.55.393

摘要
采用嵌入原子法(EAM)计算了Cu，Ag，Au，Ni，Al，Rh，Ir，Pd，Pt和Pb等10种面心立方(fcc)金属的层错能，除Rh和Ir两种金属外，其他金属的计算结果和实验结果基本一致.

关键词:
面心立方金属 /

层错能 /

EAM
Abstract
The stacking fault energies of fcc metals have been calculated by the embedded-atom method for 10 fcc metals, Cu, Ag, Au, Ni, Al, Rh, Ir, Pd, Pt and Pb. The calculated values are in good agreement with experimental results, that of Rh and Ir excepted.

Keywords:
fcc metals /

stacking fault energy /

embedded-atom method
作者及机构信息
张建民,

吴喜军,

黄育红,

徐可为
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