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中国物理学会期刊

电场下用扫描隧道显微镜对针尖原子扩散的观察

CSTR: 32037.14.aps.46.679

OBSERVATION OF BIAS VOLTAGE INDUCED ATOMIC DIFFUSION ON A GOLD STM TIP

CSTR: 32037.14.aps.46.679
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  • 用扫描隧道显微镜(STM)研究了在金针尖和金样品间施加大偏压时所发生的各种不同的现象.在缓变大偏压的作用下,观察到针尖原子会发生场致扩散,导致针尖形状发生变化,并且还观察到了场发射和共振隧穿现象.提出了针尖原子的场致扩散是偏压电场使针尖表面极化引起的这一机理,并且指出了这种场致扩散在用大脉冲偏压作表面加工中起着重要的作用

     

    By gradually varying the bias voltage between the gold tip and the gold sample, it is observed with the scanning tunneling microscope that large bias voltages may induce atoms to diffuse on the gold tip and ofter result in an increasing of the tip length. We also observed the field emission and resonant tunneling phenomena. A mechanism based on the polarization of the tip is proposed for the field-induced atomic diffusion. Such field induced diffusion is believed to be responsible for surface modification with large bias voltage pulses.

     

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