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本文研究了A-Si:H薄膜中氢原子总含量及硅-氢键合形式随薄膜中晶化程度的变化规律。指出,当晶粒大小为200±50?范围氢含量陡然下降,硅-氢键合由Si-H明显地向Si-H2转化。认为,200±50?是微晶硅膜向多晶硅膜转化的一个相交点。This paper presents the dependence of the hydrogen contents and the Si-H bonding structure on crystallization in a-Si: H films. The hydrogen contents decreases dramatically and the bonding from transforms from Si-H to Si-H2 obviously when the grain size increases to about 200±50?. We suggest that the 200±50? is a phase transition point corresponds to transformation from mirco-crystalline-Si: H to poly- crystalline-like modification.







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