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中国物理学会期刊

晶化对A-Si:H膜中氢含量及键合形式的作用

CSTR: 32037.14.aps.33.1472

THE EFFECT OF CRYSTALLIZATION ON HYDROGEN CONTENTS AND BONDING STRUCTURE OF A-Si:H FILMS

CSTR: 32037.14.aps.33.1472
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  • 本文研究了A-Si:H薄膜中氢原子总含量及硅-氢键合形式随薄膜中晶化程度的变化规律。指出,当晶粒大小为200±50?范围氢含量陡然下降,硅-氢键合由Si-H明显地向Si-H2转化。认为,200±50?是微晶硅膜向多晶硅膜转化的一个相交点。

     

    This paper presents the dependence of the hydrogen contents and the Si-H bonding structure on crystallization in a-Si: H films. The hydrogen contents decreases dramatically and the bonding from transforms from Si-H to Si-H2 obviously when the grain size increases to about 200±50?. We suggest that the 200±50? is a phase transition point corresponds to transformation from mirco-crystalline-Si: H to poly- crystalline-like modification.

     

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