Surface impedance of metals in infrared region is calculated for an arbitrary Fermi surface. Expressions applicable to all cases of skin-effect (normal, anomalous and intermediate) are obtained. For anomalous skin-effect a component of electric field decreases very slowly in the depth of metals, which leads to the transparency of metallic films. It is proposed to develop a contactless method for the purity control of well refined metals by means of this effect. Surface impedance in a perpendicular magnetic field is also considered.
Surface impedance of metals in infrared region is calculated for an arbitrary Fermi surface. Expressions applicable to all cases of skin-effect (normal, anomalous and intermediate) are obtained. For anomalous skin-effect a component of electric field decreases very slowly in the depth of metals, which leads to the transparency of metallic films. It is proposed to develop a contactless method for the purity control of well refined metals by means of this effect. Surface impedance in a perpendicular magnetic field is also considered.
In this article general formulas are derived which account for the influence of X-ray geometry, the nonideal adjustment of goniometer and the parameters of recording system on the centre of gravity, on the mean-square width and on the Fourier coefficients of the line profile. Several related problems are briefly discussed.
In this article general formulas are derived which account for the influence of X-ray geometry, the nonideal adjustment of goniometer and the parameters of recording system on the centre of gravity, on the mean-square width and on the Fourier coefficients of the line profile. Several related problems are briefly discussed.