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Terahertz pulses accelerating and scanning electron beam can break through the limitation of accelerating electric field between cathodes and grids in traditional streak tubes, thus reducing the time dispersion and enhancing the temporal resolution of time-scanning detectors. Based on this new technology, in this paper an ultra-small structured time-resolved detector with no focusing pole is designed. The terahertz pulse coupling/enhancing device suitable for acceleration zone and scanning zone is designed and optimized. The enhanced coefficient of the terahertz pulse electric field in the device reaches 9.39. In the paper, the relationship between time dispersion in acceleration zone and the moment of electrons emission is analyzed theoretically. We also analyze the influence of space charge effect on time dispersion. The electronic trajectory tracking is used to calculate and analyze the time dispersion of this detector, and finally the time resolution is better than 50fs.
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Keywords:
- streak camera /
- terahertz /
- temporal resolution
[1] van Oudheusden T, Pasmans P L E M, van der Geer S B, de Loos M J, van der Wiel M J, Luiten O J 2010 Phys. Rev. Lett. 105 264801Google Scholar
[2] Veisz L, Kurkin G, Chernov K, Tarnetsky V, Apolonski A, Krausz F, Fill E 2007 New J. Phys. 9 451Google Scholar
[3] Rousse A, Rischel C, Gauthier J C 2001 Rev. Mod. Phys. 73 17Google Scholar
[4] Gotchev O V, Jaanimagi P A, Knauer J P, Marshall F J, Meyerhofer D D, Bassett N L, Oliver J B 2003 Rev. Sci. Instru. 74 2178Google Scholar
[5] Becker W 2012 J. Microsc. 2472 119Google Scholar
[6] Krishnan R V, Saitoh H, Terada H, Centonze V E, Herman B 2003 Rev. Sci. Instrum. 745 2714Google Scholar
[7] Wang Y, Wang Z, Dang W 2013 Sci. China-Chem. 4312 1713
[8] 刘雄波, 林丹樱, 吴茜茜, 严伟, 罗腾, 杨志刚, 屈军乐 2018 67 178701Google Scholar
Liu X B, Lin D Y, Wu Q Q, Yan W, Luo T, Yang Z G, Qu L 2018 Acta Phys. Sin. 67 178701Google Scholar
[9] Kinoshita K, Suyama M, Ito M 1990 Proc. SPIE 1358 490Google Scholar
[10] Lebedev V B, Feldman G G, Veinbein P 1999 Proc. SPIE 3516 74Google Scholar
[11] Kinoshita K, Ishihara Y, Ai T, Hino S, Inagaki Y, Mori K, Goto M, Niikura F, Takahashi A, Uchiyama K, Abe S 2016 The 31st International Congress on High-speed Imaging and Photonics Osaka, Japan, November 7–10, 2016 pp305−310
[12] Pálfalvi L, Fülöp J A, Tóth G, Hebling J 2014 Phys. Rev. Spec. Top-AC 17 031301
[13] Wei Y, Ischebeck R, Dehler M, Ferrari E, Hiller N, Jamison S, Xia G, Hanahoe K, Li Y, Smith J D A, Welsch C P 2018 Nucl. Instr. and Meth. 877 173Google Scholar
[14] Huang R, Fallahi A, Wu X J, Cankaya H, Calendron A L, Ravi K, Zhang D F, Nanni E A, Hong K H, Kärtner F X 2016 Optica 3 1209Google Scholar
[15] Huang W R, Nanni E A, Ravi K, Hong K H, Fallahi A, Liang J W, Phillip D K, Luis E Z, Kärtner F X 2015 Sci. Rep. 5 14899Google Scholar
[16] Niu H, Degtyareva V, Platonov V, Prokhorov A, Schelev M 1989 Proceedings of Spie 1032 79Google Scholar
[17] Siwick B J, Dwyer J R, Jordan R E, Miller R 2002 J. Appl. Phys. 92 1643Google Scholar
[18] QianB, Hani E, Elsayed Ali 2003 J. Appl. Phys. 94 803Google Scholar
[19] Siwick B J, Dwyer J R, Jordan R E, Miller R J D 2003 J. Appl. Phys. 94 807
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[1] van Oudheusden T, Pasmans P L E M, van der Geer S B, de Loos M J, van der Wiel M J, Luiten O J 2010 Phys. Rev. Lett. 105 264801Google Scholar
[2] Veisz L, Kurkin G, Chernov K, Tarnetsky V, Apolonski A, Krausz F, Fill E 2007 New J. Phys. 9 451Google Scholar
[3] Rousse A, Rischel C, Gauthier J C 2001 Rev. Mod. Phys. 73 17Google Scholar
[4] Gotchev O V, Jaanimagi P A, Knauer J P, Marshall F J, Meyerhofer D D, Bassett N L, Oliver J B 2003 Rev. Sci. Instru. 74 2178Google Scholar
[5] Becker W 2012 J. Microsc. 2472 119Google Scholar
[6] Krishnan R V, Saitoh H, Terada H, Centonze V E, Herman B 2003 Rev. Sci. Instrum. 745 2714Google Scholar
[7] Wang Y, Wang Z, Dang W 2013 Sci. China-Chem. 4312 1713
[8] 刘雄波, 林丹樱, 吴茜茜, 严伟, 罗腾, 杨志刚, 屈军乐 2018 67 178701Google Scholar
Liu X B, Lin D Y, Wu Q Q, Yan W, Luo T, Yang Z G, Qu L 2018 Acta Phys. Sin. 67 178701Google Scholar
[9] Kinoshita K, Suyama M, Ito M 1990 Proc. SPIE 1358 490Google Scholar
[10] Lebedev V B, Feldman G G, Veinbein P 1999 Proc. SPIE 3516 74Google Scholar
[11] Kinoshita K, Ishihara Y, Ai T, Hino S, Inagaki Y, Mori K, Goto M, Niikura F, Takahashi A, Uchiyama K, Abe S 2016 The 31st International Congress on High-speed Imaging and Photonics Osaka, Japan, November 7–10, 2016 pp305−310
[12] Pálfalvi L, Fülöp J A, Tóth G, Hebling J 2014 Phys. Rev. Spec. Top-AC 17 031301
[13] Wei Y, Ischebeck R, Dehler M, Ferrari E, Hiller N, Jamison S, Xia G, Hanahoe K, Li Y, Smith J D A, Welsch C P 2018 Nucl. Instr. and Meth. 877 173Google Scholar
[14] Huang R, Fallahi A, Wu X J, Cankaya H, Calendron A L, Ravi K, Zhang D F, Nanni E A, Hong K H, Kärtner F X 2016 Optica 3 1209Google Scholar
[15] Huang W R, Nanni E A, Ravi K, Hong K H, Fallahi A, Liang J W, Phillip D K, Luis E Z, Kärtner F X 2015 Sci. Rep. 5 14899Google Scholar
[16] Niu H, Degtyareva V, Platonov V, Prokhorov A, Schelev M 1989 Proceedings of Spie 1032 79Google Scholar
[17] Siwick B J, Dwyer J R, Jordan R E, Miller R 2002 J. Appl. Phys. 92 1643Google Scholar
[18] QianB, Hani E, Elsayed Ali 2003 J. Appl. Phys. 94 803Google Scholar
[19] Siwick B J, Dwyer J R, Jordan R E, Miller R J D 2003 J. Appl. Phys. 94 807
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