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With the improvement of voltage level of electrical equipment, the requirement for the reliability of polymer dielectric materials in electrical equipment is much more strict. However, there are inevitably some defects in the manufacturing process of polymer dielectric materials, such as bubbles, inclusions, and so on. Therefore the life of electrical equipment will be greatly decreased when partial discharge occurs in a high electric field. In order to prevent and reduce the accident caused by the aging of polymer dielectric material in the electrical equipment, electrical aging life needs to be reasonably estimated. Based on the microscopic mechanism of partial discharge aging model, this paper suggests a stochastic differential equation for the electrical crack growth by using a non-equilibrium statistical physics theory, and then functions of breakdown probability, reliability, and electrical aging life due to the application of electric field are derived. Finally, a detailed analysis for the polyetllyleneterephthalate (PET) film is carried out, and the theoretical life of electrical aging is compared with experimental data. Results show that the theoretical values are consistent with the experimental data. So the aging life equations of polymer dielectrics derived in this paper can be used effectively in the quantitative analysis and may be helpful for the estimation of electrical life.
[1] Yang K, Zhang G Z, Zhao W B, Yan Z 2008 Chin. Soc. for Elec. Eng. 28 148 (in Chinese)[杨凯, 张冠军, 赵文彬, 严璋 2008 中国电机工程学报 28 148]
[2] Li S T, Zheng X Q 2006 Polymer Electrical Treeing (Beijing: China Machine Press) p10 (in Chinese) [李盛涛, 郑晓泉 2006 聚合物电树枝化(北京:机械工业出版社)第10页]
[3] Zheng X Q, Xie A S, Li S T 2007 Acta Phys. Sin. 56 5494 (in Chinese)[郑晓泉, 谢安生, 李盛涛 2007 56 5494]
[4] Chen X R, Xu Y, Liu Y, Cao X L 2012 Acta Phys. Sin. 61 087701 (in Chinese) [陈向荣, 徐阳, 刘英, 曹晓珑 2012 61 087701]
[5] Zhao L, Su J C, Pan Y F, Zhang X B 2012 Chin. Phys. B 21 033102
[6] Straton R 1961 Prog. Dielectrics 3 233
[7] O’Dwyer J J 1969 J. Electrochem. Soc. 116 239
[8] Budenstein P P 1980 IEEE Trans. Electron. Insul. 15 225
[9] Jonscher A K, Laccste R 1984 IEEE Trans. Electron. Insul. 19 190
[10] Simoni L 1981 IEEE Trans. Electron. Insul. 16 277
[11] Kao C K 1984 J. Appl. Phys. 55 752
[12] Liao R J, Zhou T C, Chen G, Yang L J 2012 Acta Phys. Sin. 61 017201 (in Chinese) [廖瑞金, 周天春, George Chen, 杨丽君 2012 61 017201]
[13] Xie A S, Li S T, Zheng X Q 2008 Acta Phys. Sin. 57 3828 (in Chinese)[谢安生, 李盛涛, 郑晓泉 2008 57 3828]
[14] Xing X S 1991 Adv. Mech. 21 153 (in Chinese)[邢修三 1991 力学进展 21 153]
[15] Xing X S 1986 Sci. Chin. (Vol. A) 29 501 (in Chinese) [邢修三 1986 中国科学(A辑) 29 501]
[16] Bahder G, Garrity T, Duxbury M 1983 Phys. Rev. Lett. 53 1121
[17] Townsend J S 1910 The Theory of Ionization of Gases by Collision (London: Constable & Company Ltd.) pp1-24
[18] O'Dwyer J J 1984 IEEE Trans. Electron. Insul. 19 1
[19] Kottalam J, Lindenberg K, West B J 1987 J. Stat. Phys. 42 979
[20] Van Kampen N G 1981 J. Stat. Phys. 24 175
[21] Zou J, Xing X S 1997 Trans. Beijing Inst. Technol. 17 160 (in Chinese) [邹健, 邢修三 1997 北京理工大学学报 17 160]
[22] Dissdo L A, Fothergill J C 1992 Electrical Degradation and Breakdown in Polymers (London: Peter Peregrinus Ltd.) pp323-329
[23] Liu F D, Yang B T, Tu D M 1992 Acta Phys. Sin. 41 333 (in Chinese)[刘付德, 杨百屯, 屠德民 1992 41 333]
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[1] Yang K, Zhang G Z, Zhao W B, Yan Z 2008 Chin. Soc. for Elec. Eng. 28 148 (in Chinese)[杨凯, 张冠军, 赵文彬, 严璋 2008 中国电机工程学报 28 148]
[2] Li S T, Zheng X Q 2006 Polymer Electrical Treeing (Beijing: China Machine Press) p10 (in Chinese) [李盛涛, 郑晓泉 2006 聚合物电树枝化(北京:机械工业出版社)第10页]
[3] Zheng X Q, Xie A S, Li S T 2007 Acta Phys. Sin. 56 5494 (in Chinese)[郑晓泉, 谢安生, 李盛涛 2007 56 5494]
[4] Chen X R, Xu Y, Liu Y, Cao X L 2012 Acta Phys. Sin. 61 087701 (in Chinese) [陈向荣, 徐阳, 刘英, 曹晓珑 2012 61 087701]
[5] Zhao L, Su J C, Pan Y F, Zhang X B 2012 Chin. Phys. B 21 033102
[6] Straton R 1961 Prog. Dielectrics 3 233
[7] O’Dwyer J J 1969 J. Electrochem. Soc. 116 239
[8] Budenstein P P 1980 IEEE Trans. Electron. Insul. 15 225
[9] Jonscher A K, Laccste R 1984 IEEE Trans. Electron. Insul. 19 190
[10] Simoni L 1981 IEEE Trans. Electron. Insul. 16 277
[11] Kao C K 1984 J. Appl. Phys. 55 752
[12] Liao R J, Zhou T C, Chen G, Yang L J 2012 Acta Phys. Sin. 61 017201 (in Chinese) [廖瑞金, 周天春, George Chen, 杨丽君 2012 61 017201]
[13] Xie A S, Li S T, Zheng X Q 2008 Acta Phys. Sin. 57 3828 (in Chinese)[谢安生, 李盛涛, 郑晓泉 2008 57 3828]
[14] Xing X S 1991 Adv. Mech. 21 153 (in Chinese)[邢修三 1991 力学进展 21 153]
[15] Xing X S 1986 Sci. Chin. (Vol. A) 29 501 (in Chinese) [邢修三 1986 中国科学(A辑) 29 501]
[16] Bahder G, Garrity T, Duxbury M 1983 Phys. Rev. Lett. 53 1121
[17] Townsend J S 1910 The Theory of Ionization of Gases by Collision (London: Constable & Company Ltd.) pp1-24
[18] O'Dwyer J J 1984 IEEE Trans. Electron. Insul. 19 1
[19] Kottalam J, Lindenberg K, West B J 1987 J. Stat. Phys. 42 979
[20] Van Kampen N G 1981 J. Stat. Phys. 24 175
[21] Zou J, Xing X S 1997 Trans. Beijing Inst. Technol. 17 160 (in Chinese) [邹健, 邢修三 1997 北京理工大学学报 17 160]
[22] Dissdo L A, Fothergill J C 1992 Electrical Degradation and Breakdown in Polymers (London: Peter Peregrinus Ltd.) pp323-329
[23] Liu F D, Yang B T, Tu D M 1992 Acta Phys. Sin. 41 333 (in Chinese)[刘付德, 杨百屯, 屠德民 1992 41 333]
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