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Charge coupled device (CCD) is a key component in a remote sensing system. In order to obtain high signal-to-noise ratio (SNR) and dynamic range in low illumination and quantization circumstance, first, according to CCD architecture and noise physical characteristics, relationship between analog gain quantization step and CCD SNR is proposed; next, integrating sphere calibration system is established, shot noise, photo response nonuniformity and noise floor model are also built, and the next relationship between analog gain and SNR in low illumination condition is analyzed thoroughly; finally, the practical photographing system is built, and remote images in different gain parameters are acquired. Theoretical analysis, experimental calibration, and practical images all indicate that when analog gain is increased by one to two times, the SNR is improved greatly and dynamic range is acceptable.
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Keywords:
- charge coupled device /
- analog gain /
- signal noise ratio /
- remote sensing system
[1] Wang Z J, Tang B Q, Xiao Z G, Liu M B, Huang S Y, Zhang Y 2010 Acta Phys. Sin. 59 4136 (in Chinese) [王祖君、唐本奇、肖志刚、刘敏波、黄绍艳、张 勇 2010 59 4136]
[2] Du H D, Huang S X, Shi H Q 2008 Acta Phys. Sin. 57 7685 (in Chinese) [杜华栋、黄思训、石汉青 2008 57 4136]
[3] Zhang C M, Huang W J, Zhang B C 2010 Acta Phys. Sin. 59 5479 (in Chinese) [张淳民、黄伟健、赵葆常 2010 59 5479]
[4] Holst G C 2008 Electro-Optical Imaging System Performance (Bellingham: SPIE Optical Engineering Press) p57
[5] Holst G C 2007 CMOS/CCD Sensors and Camera Systems (Bellingham: SPIE Optical Engineering Press) p178
[6] Healey G E, Kondepudy R 1994 IEEE trans. Pattern Anal. Mach. Intel. 16 267
[7] Irie K, McKinnon A E, Unsworth K, Woodhead I M 2008 IEEE Trans. Circuits and Systems for Video Technology. 18 280
[8] Chen L, Zhang X, Lin J, Sha D 2009 Opt. Laser Technol. 41 574
[9] Yang B X 2005 Spacecraft Recovery & Remote Sensing 26 22 (in Chinese)[杨秉新 2005 航天返回与遥感 26 22]
[10] Hu J, Wang D 2009 Opt. Precision Eng. 8 1819 (in Chinese) [胡 君、王 栋 2009 光学精密工程 8 1819]
[11] Ma T B, Guo Y F, Li Y F 2010 Opt. Precision Eng. 18 2028 (in Chinese) [马天波、郭永飞、李云飞 2010 光学精密工程 18 2028]
[12] Steven L S 1999 Opt. Eng. 38 821
[13] Robert D F, Theodore T 2001 Opt. Eng. 40 574
[14] Robert D F 1999 Opt. Eng. 38 1229
[15] Robert D F, Theodore T, Jason R C, James A M 2002 Opt. Eng. 41 1957
[16] Robert D F, Theodore T 1999 Opt. Eng. 38 815
[17] Zarco-Tejada P J, Berni J A, Suarez L 2009 Remote Sens. Environ.113 1262
[18] Tominaga. Shoji, Tanaka Norihiro 2008 J. Electron Imaging. 17 43022
[19] Olivier Romain, Thomas Ea, Patrick Garda 2007 Opt. Eng. 26 103202
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[1] Wang Z J, Tang B Q, Xiao Z G, Liu M B, Huang S Y, Zhang Y 2010 Acta Phys. Sin. 59 4136 (in Chinese) [王祖君、唐本奇、肖志刚、刘敏波、黄绍艳、张 勇 2010 59 4136]
[2] Du H D, Huang S X, Shi H Q 2008 Acta Phys. Sin. 57 7685 (in Chinese) [杜华栋、黄思训、石汉青 2008 57 4136]
[3] Zhang C M, Huang W J, Zhang B C 2010 Acta Phys. Sin. 59 5479 (in Chinese) [张淳民、黄伟健、赵葆常 2010 59 5479]
[4] Holst G C 2008 Electro-Optical Imaging System Performance (Bellingham: SPIE Optical Engineering Press) p57
[5] Holst G C 2007 CMOS/CCD Sensors and Camera Systems (Bellingham: SPIE Optical Engineering Press) p178
[6] Healey G E, Kondepudy R 1994 IEEE trans. Pattern Anal. Mach. Intel. 16 267
[7] Irie K, McKinnon A E, Unsworth K, Woodhead I M 2008 IEEE Trans. Circuits and Systems for Video Technology. 18 280
[8] Chen L, Zhang X, Lin J, Sha D 2009 Opt. Laser Technol. 41 574
[9] Yang B X 2005 Spacecraft Recovery & Remote Sensing 26 22 (in Chinese)[杨秉新 2005 航天返回与遥感 26 22]
[10] Hu J, Wang D 2009 Opt. Precision Eng. 8 1819 (in Chinese) [胡 君、王 栋 2009 光学精密工程 8 1819]
[11] Ma T B, Guo Y F, Li Y F 2010 Opt. Precision Eng. 18 2028 (in Chinese) [马天波、郭永飞、李云飞 2010 光学精密工程 18 2028]
[12] Steven L S 1999 Opt. Eng. 38 821
[13] Robert D F, Theodore T 2001 Opt. Eng. 40 574
[14] Robert D F 1999 Opt. Eng. 38 1229
[15] Robert D F, Theodore T, Jason R C, James A M 2002 Opt. Eng. 41 1957
[16] Robert D F, Theodore T 1999 Opt. Eng. 38 815
[17] Zarco-Tejada P J, Berni J A, Suarez L 2009 Remote Sens. Environ.113 1262
[18] Tominaga. Shoji, Tanaka Norihiro 2008 J. Electron Imaging. 17 43022
[19] Olivier Romain, Thomas Ea, Patrick Garda 2007 Opt. Eng. 26 103202
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