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Zhang Guan-Jie, Yang Hao, Zhang Nan. Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction. Acta Physica Sinica,
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2018, 67(21): 217802.
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Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao. Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica,
2018, 67(19): 197203.
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Li Xiao-Dong, Li Hui, Li Peng-Shan. High pressure single-crystal synchrotron X-ray diffraction technique. Acta Physica Sinica,
2017, 66(3): 036203.
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Chen Ren-Gang, Deng Jin-Xiang, Chen Liang, Kong Le, Cui Min, Gao Xue-Fei, Pang Tian-Qi, Miao Yi-Ming. Spectroscopic ellipsometry study of the Zn3N2 films prepared by radio-frequency sputtering. Acta Physica Sinica,
2014, 63(13): 137701.
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Han Liang, Liu De-Lian, Chen Xian, Zhao Yu-Qing. The effect of the interlayer CrN on adhesion characteristics of ta-C films on high-speed steel substrate. Acta Physica Sinica,
2013, 62(9): 096802.
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Xu Xiao-Ming, Miao Wei, Tao Kun. Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica,
2011, 60(8): 086101.
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Lü Hui-Min, Shi Zhen-Hai, Zhao Chao, Wei Ping. Preparation and mechanism analysis of hollow microspheres/reticulated composite carbon foam. Acta Physica Sinica,
2010, 59(11): 7956-7960.
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica,
2009, 58(4): 2742-2745.
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Li Jia, Yang Chuan-Zheng, Zhang Xi-Gui, Zhang Jian, Xia Bao-Jia. XRD studies on the electrode materials in the charge-discharge process of a graphite/Li（Ni1/3Co1/3Mn1/3）O2 battery. Acta Physica Sinica,
2009, 58(9): 6573-6581.
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Chang Jun, Li Hua, Han Ying-Jun, Tan Zhi-Yong, Cao Jun-Cheng. Material growth and characterization of terahertz quantum-cascade lasers. Acta Physica Sinica,
2009, 58(10): 7083-7087.
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng. Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica,
2008, 57(11): 7119-7125.
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Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei. X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica,
2008, 57(9): 5962-5967.
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Tan Guo-Tai, Chen Zheng-Hao. XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica,
2007, 56(3): 1702-1706.
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Lü Hui-Min, Chen Guang-De, Yan Guo-Jun, Ye Hong-Gang. The growth mechanism of monocrystal aluminum nitride nanowires at low temperature. Acta Physica Sinica,
2007, 56(5): 2808-2812.
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Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia. New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica,
2006, 55(3): 1325-1335.
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Wang Rui-Min, Chen Guang-De, Zhu You-Zhang. Micro-Raman scattering study of hexagonal InGaN epitaxial layer. Acta Physica Sinica,
2006, 55(2): 914-919.
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Zhang Xiao-Dan, Zhao Ying, Gao Yang-Tao, Zhu Feng, Wei Chang-Chun, Sun Jian, Geng Xin-Hua, Xiong Shao-Zhen. Fabrication of intrinsic microcrystalline silicon thin films used for solar cells and its structure. Acta Physica Sinica,
2005, 54(10): 4874-4878.
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Sun Guang-Ai, Chen Bo, Du Hong-Lin. Anomalous thermal expansion of R(Fe, Mo)12 compounds. Acta Physica Sinica,
2005, 54(9): 4240-4244.
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Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma. X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica,
2004, 53(10): 3510-3514.
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